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In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Gut. Zustand: Gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Sprache: Englisch
Verlag: Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Sprache: Englisch
Verlag: Taylor & Francis Ltd Jun 2020, 2020
ISBN 10: 0367573555 ISBN 13: 9780367573553
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Neuware - This book focusses on the spacer engineering aspects of novel MOS-based device-circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.
Taschenbuch. Zustand: Neu. VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers | Brajesh Kumar Kaushik (u. a.) | Taschenbuch | xxi | Englisch | 2017 | Springer | EAN 9789811074691 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. VLSI Design and Test | 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers | Ambika Prasad Shah (u. a.) | Taschenbuch | xviii | Englisch | 2022 | Springer | EAN 9783031215131 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbPaperback. Zustand: Brand New. 614 pages. 9.25x6.10x1.42 inches. In Stock.
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Taschenbuch. Zustand: Neu. VLSI Design and Test | 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers | Anirban Sengupta (u. a.) | Taschenbuch | xvi | Englisch | 2019 | Springer | EAN 9789813297661 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer-Verlag New York Inc, 2018
ISBN 10: 9811074690 ISBN 13: 9789811074691
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbPaperback. Zustand: Brand New. revised edition. 840 pages. 9.25x6.10x1.73 inches. In Stock.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Zustand: New.
Sprache: Englisch
Verlag: Springer-Verlag New York Inc, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 174,63
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In den WarenkorbPaperback. Zustand: Brand New. 792 pages. 9.25x6.10x1.61 inches. In Stock.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 202,76
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In den WarenkorbZustand: New.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbHardcover. Zustand: Brand New. 138 pages. 9.50x6.50x0.55 inches. In Stock.
EUR 187,38
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In den WarenkorbZustand: New. Brajesh Kumar Kaushik received Ph.D. degree in 2007 from Indian Institute of Technology Roorkee, India. He served Vinytics Peripherals Pvt. Ltd., Delhi, as Research and Development Engineer in microprocessor, microcontroller, and DSP (Di.
Sprache: Englisch
Verlag: Taylor & Francis Inc Jun 2017, 2017
ISBN 10: 1498783597 ISBN 13: 9781498783590
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This book focusses on the spacer engineering aspects of novel MOS-based device-circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.