Wang laung terng (9 Ergebnisse)

Hardcover. Zustand: Very Good. 1. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Hardcover. Zustand: Very Good. 1. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Zustand: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.

Paperback. Zustand: Brand New. 1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.

Hardcover. Zustand: Brand New. 1st edition. 777 pages. 9.25x7.50x2.00 inches. In Stock.

Zustand: New. A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students. Series: Systems on Silicon. Num Pages: 896 pages, Approx. 600 illustrations. BIC Classification: THR. Category: (P) Professional & Vocational. Dimension: 242 x 199 x 38. Weight in Grams: 1602. . 2007. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.…

Zustand: New. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (.

Hardcover. Zustand: Brand New. illustrated edition. 896 pages. 9.50x7.50x1.50 inches. In Stock.

Zustand: gut. 2006. VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon) In englischer Sprache. pages.