VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon) - Hardcover

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

 
9780123705976: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Hardcover
ISBN 10: 0123705975 ISBN 13: 9780123705976
Verlag: Morgan Kaufmann Publishers In, 2006

Inhaltsangabe

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

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Über die Autorinnen und Autoren

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

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Verlag
Morgan Kaufmann Publishers In
Erscheinungsdatum
2006
Sprache
Englisch
ISBN 10 
0123705975
ISBN 13 
9780123705976
Einband
Tapa dura
Anzahl der Seiten
808
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar

Weitere beliebte Ausgaben desselben Titels

9781493300860: VLSI Test Principles and Architectures: Design for Testability

Vorgestellte Ausgabe

ISBN 10:  1493300865 ISBN 13:  9781493300860
Verlag: Morgan Kaufmann, 2014
Softcover