Erscheinungsdatum: 1979
Anbieter: Literaturhökerei Wiese, Hardegsen, Deutschland
Proceedings of the Geological Society of China 22: 105-120, 3 figs, 2 pls 8vo, offprint.
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Sprache: Englisch
Verlag: Springer Publishing Company, 2018
ISBN 10: 0826184456 ISBN 13: 9780826184450
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Sprache: Englisch
Verlag: World Scientific Publishing Co, 2018
ISBN 10: 9813271779 ISBN 13: 9789813271777
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In den WarenkorbZustand: New. pp. 1334.
Sprache: Englisch
Verlag: World Scientific Pub Co Inc, 1991
ISBN 10: 9810207220 ISBN 13: 9789810207229
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In den WarenkorbPaperback. Zustand: Brand New. 340 pages. 6.00x0.71x9.00 inches. In Stock.
Sprache: Englisch
Verlag: World Scientific Publishing Co, 2018
ISBN 10: 9813271779 ISBN 13: 9789813271777
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Sprache: Chinesisch
Verlag: China Bookster Publishing House, 2019
ISBN 10: 7506875381 ISBN 13: 9787506875387
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In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 764 pages. 10.00x7.01x1.53 inches. In Stock.
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In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 724 pages. 9.61x6.18x1.64 inches. In Stock.
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Taschenbuch. Zustand: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. Advances in X-Ray Analysis | C. S. Barrett (u. a.) | Taschenbuch | xxi | Englisch | 2013 | Springer | EAN 9781461366676 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. The Search for Charm, Beauty, and Truth at High Energies | S. C. Ting (u. a.) | Taschenbuch | xi | Englisch | 2013 | Springer | EAN 9781461296577 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Sprache: Englisch
Verlag: Springer US, Springer New York, 2013
ISBN 10: 1461296579 ISBN 13: 9781461296577
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The search for flavored particles is one of the most;interesting topics in high energy physics. Many experimental groups are working on this subject, but the solution to many of the problems are still open. Therefore it seemed very useful that people interested in these problems can probe then in a discussion. This is the aim of this Europhysics Study Conference, which has been organized both as a conference and a workshop. The present experimental knowledge on branching ratios, life times, cross sections and production mechanisms of flavored parti cles has been presented in general talks and discussed in the morn ing sessions, as well as the bases of the theoretical ideas and pre dictions. The experimental methods: visual detectors, live targets, high resolution vertex detectors, special triggers of search on fla vored particles, have been treated in the afternoon panels. These proceedings contain the talks and panel discussions with the exception of a few small contributions to the panels and talks by C. Baltay ('Search for charm and new flavors with bubble cham bers'), G. Alteralle ('Lifetime of charm and new flavors'), P. Monacelli ('Results on charm production from a CERN Beam Dump exper iment'), A. Capone ('Experimental study of same-sign dimunon events produced in neutrino and anti-neutrino beams').
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.
Sprache: Englisch
Verlag: Springer US, Springer New York, 2013
ISBN 10: 1461366674 ISBN 13: 9781461366676
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The 'Denver Conference' is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: 'Surface and Near-Surface X-Ray Spectroscopy. ' The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed 'Recent Developments and Results in Total-Reflection X-Ray Fluorescence. ' Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on 'Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. ' He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.
Sprache: Englisch
Verlag: World Scientific Publishing Co, 2018
ISBN 10: 9813271779 ISBN 13: 9789813271777
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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In den WarenkorbGebunden. Zustand: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
Taschenbuch. Zustand: Neu. Advances in Multimedia Information Processing - PCM 2007 | 8th Pacific Rim Conference on Multimedia, Hong Kong, China, December 11-14, 2007, Proceedings | Horace H. S. Ip (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2007 | Springer | EAN 9783540772545 | Verantwortliche Person für die EU: Springer Nature Customer Service Center GmbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, 2007
ISBN 10: 3540772545 ISBN 13: 9783540772545
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In den WarenkorbKartoniert / Broschiert. Zustand: New. This book constitutes the refereed proceedings of the 8th Pacific Rim Conference on Multimedia, PCM 2007, held in Hong Kong, China, in December 2007. The 73 revised full papers and 21 revised posters presented were carefully reviewed and selected from 24.
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Sprache: Englisch
Verlag: Springer-Verlag New York Inc, 2008
ISBN 10: 3540772545 ISBN 13: 9783540772545
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In den WarenkorbPaperback. Zustand: Brand New. 1st edition. 834 pages. 9.21x6.14x1.18 inches. In Stock.