Ting s c (48 Ergebnisse)

Proceedings of the Geological Society of China 22: 105-120, 3 figs, 2 pls 8vo, offprint.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. In English.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. pp. 1334.

Hardcover. Zustand: VERY GOOD. Replica of the Frescoes of Fahai Temple, printed accordion style in cream embossed hard covers. Measures 18' and 3' long. Clean, sharp copy with no flaws in original slipcase.

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. In English.

Paperback. Zustand: Brand New. 340 pages. 6.00x0.71x9.00 inches. In Stock.

Zustand: New.

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. …

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.…

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The 'Denver Conference' is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: 'Surface and Near-Surface X-Ray Spectroscopy. ' The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed 'Recent Developments and Results in Total-Reflection X-Ray Fluorescence. ' Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on 'Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. ' He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.…

Paperback. Zustand: Brand New. reprint edition. 764 pages. 10.00x7.01x1.53 inches. In Stock.

Zustand: New. In English.

Paperback. Zustand: Brand New. reprint edition. 724 pages. 9.61x6.18x1.64 inches. In Stock.

Zustand: Used. pp. 778.

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Advances in X-Ray Analysis | Volume 33 | Charles S. Barrett (u. a.) | Taschenbuch | xx | Englisch | 2012 | Springer | EAN 9781461399988 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Zustand: Used. pp. 778.

Zustand: New. In English.

Zustand: New. In English.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Gebunden. Zustand: New. 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction .

Gebunden. Zustand: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Pacific-Rim Conference on Multimedia (PCM) was held in Hong Kong, at the City University of Hong Kong, during December 11-14, 2007. Started in 2000, PCM has been held in various places around the Pacific Rim, including Sydney, Beijing, Hsinchu, Singapore, Tokyo, Jeju, and Zhejiang in chronological order. PCM is a major annual international conference organized as a forum for the dissemination of state-of-the-art technological advances and research results in the fields of theoretical, experimental, and applied multimedia analysis and processing. PCM 2007 was organized into 5 different tracks with a total of 247 submissions from 26 countries and regions including Australia, Belgium, Canada, China, Japan, Korea, New Zealand, Singapore, Spain, Taiwan, the UK and the USA. Among the five tracks, 'multimedia analysis and retrieval' received the most number of submissions (34% of the submissions). After a rigorous review process, 73 papers were accepted for oral presentations, giving an acceptance rate of under 29% for PCM 2007. In addition, 21 papers were accepted for poster presentations. We would like to thank all the Track Chairs and the reviewers for their timely handling of the paper reviews. We are particularly grateful to Chong-Wah Ngo and his team for their support of the Web-based review system throughout the process. We are also indebted to the Special Sessions Chairs, Qi Tian and Timothy Shih, for the organization of the two special sessions on 'The AVS China National Standard' and 'Multimedia Information System for Biomedical Research,' respectively. …