Sprache: Englisch
Verlag: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2004
ISBN 10: 3540206620 ISBN 13: 9783540206620
Anbieter: Ammareal, Morangis, Frankreich
Hardcover. Zustand: Bon. Ancien livre de bibliothèque. Salissures sur la tranche. Edition 2004. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Stains on the edge. Edition 2004. Ammareal gives back up to 15% of this item's net price to charity organizations.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 163,95
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In den WarenkorbZustand: New. In.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Nanoscale Characterisation of Ferroelectric Materials | Scanning Probe Microscopy Approach | Marin Alexe (u. a.) | Taschenbuch | NanoScience and Technology | xiii | Englisch | 2010 | Springer | EAN 9783642058448 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2010
ISBN 10: 3642058442 ISBN 13: 9783642058448
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer, 2004
ISBN 10: 3540206620 ISBN 13: 9783540206620
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com puter industry is turning to nanotechnology as a source of new processes and func tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the 'nano-era', a solid knowledge of the ferroelectric properties at the nano scale needs to be acquired. While the science of ferroelectrics from micro-to lar ger scale is well established, the science of nanoscale ferroelectrics is still terra in cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec ade.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 233,94
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 282 pages. German language. 9.50x6.50x0.75 inches. In Stock.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, 2010
ISBN 10: 3642058442 ISBN 13: 9783642058448
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 244,16
Anzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 296 pages. 9.00x6.00x0.71 inches. In Stock.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 346,63
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In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 346,63
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2011
ISBN 10: 3642059155 ISBN 13: 9783642059155
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the past decade direct wafer bonding has developed into a mature materials integration technology. This book presents state-of-the-art reviews of the most important applications of wafer bonding written by experts from industry and academia. The topics include bonding-based fabrication methods of silicon-on-insulator, photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and its various application areas, while the researcher in the field will find up-to-date information about this fast-moving area, including relevant patent information.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2004
ISBN 10: 3540210490 ISBN 13: 9783540210498
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the past decade direct wafer bonding has developed into a mature materials integration technology. This book presents state-of-the-art reviews of the most important applications of wafer bonding written by experts from industry and academia. The topics include bonding-based fabrication methods of silicon-on-insulator,photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and its various application areas, while the researcher in the field will find up-to-date information about this fast-moving area, including relevant patent information.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 468,79
Anzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. 524 372 Illus.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 518,59
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 499 pages. 9.25x6.25x0.75 inches. In Stock.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 517,29
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In den WarenkorbPaperback. Zustand: Brand New. 514 pages. 9.00x6.10x1.10 inches. In Stock.