Ibe eishi (9 Ergebnisse)
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices.
Nakamura, Takashi/Ibe, Eishi/Baba, Mamoru/Yahagi, Yasuo/Kameyama, Hideaki
- Hardcover
Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, DeutschlandUniversitätsbuchhandlung Herta Hold GmbH
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15 x 23 cm. 368 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Kameyama Hideaki Yahagi Yasuo Ibe Eishi Baba Mamoru Nakamura Takashi
Sprache: Englisch
Verlag: World Scientific Publishing Company, Incorporated 2008
- Hardcover
Anbieter: Majestic Books, Hounslow, Vereinigtes KönigreichMajestic Books
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EUR 118,50
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Zustand: Used. pp. xxii + 343 Figures, Illus.
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Hardcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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EUR 114,44
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Zustand: New. In.
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Kanekawa, Nobuyasu; Ibe, Eishi H.; Suga, Takashi; Uematsu, Yutaka
- Softcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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EUR 114,44
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Zustand: New. In.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Kameyama Hideaki Yahagi Yasuo Ibe Eishi Baba Mamoru Nakamura Takashi
Sprache: Englisch
Verlag: World Scientific Publishing Company, Incorporated 2008
- Hardcover
Anbieter: Biblios, frankfurt am main, DeutschlandBiblios
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EUR 119,03
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Zustand: Used. pp. xxii + 343.
- Hardcover
Anbieter: Buchpark, Trebbin, DeutschlandBuchpark
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EUR 29,90
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Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbancesby: Nobuyasu Kanekawa Eishi H. IbeTakashi Suga Yutaka Uematsu The importance of "dependability" in electronic systems is obvious, espe…cially in safety-critical or mission-critical applications. Dependability hinges on matters such as failure causes and countermeasures for soft/hard -errors in semiconductor devices, electro-magnetic interferences, power integration, and system architecture.This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples.Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability. ¿Provides a set of valuable techniques to design dependability into embedded systems;¿Offers fault mitigation techniques widely applicable in general control systems in space and ground-based transportation systems; ¿Presents fundamentals of soft-errors in semiconductor devices and their impacts and countermeasures in electronic systems such as network servers and routers;¿Describes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applications;¿Discusses vulnerability in power supply systems and how power integration is accomplished.
- Hardcover
Anbieter: Majestic Books, Hounslow, Vereinigtes KönigreichMajestic Books
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EUR 185,93
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Zustand: New. pp. 400.
- Hardcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
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EUR 200,90
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Hardcover. Zustand: Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 206,45
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Buch. Zustand: Neu. Neuware - This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutron…s and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.\* Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms\* Covers both terrestrial and avionic-level conditions\* Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary\* Written by a widely-recognized authority in soft-errors in electronic devices\* Code samples available for download from the Companion WebsiteThis book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
