Vlsi test (96 Ergebnisse)

Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Fine. 1st Edition. 378p, many figures in the text, a Fine hardback (with laminated boards) [0747600015].

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

gebundene Ausgabe. Zustand: Gut. 354 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 650.…

Zustand: New.

Zustand: New.

Hardcover. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Zustand: New.

Zustand: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.

Zustand: New.

Zustand: New.

paperback. Zustand: New. Paperback. Publisher: Electronic Industry Press. 2 Pub. Date :2008-06-01. VLSI testing and design for test methodology have been screening mature. many theories and methods for design and manufacturing sector. widely accepted. has become a basic feature of EDA tools. Systematic compilation of the book so far the mainstream methodology and structure for the reader to a deeper level of circuit design. simulation. testing and analysis to lay a good foundation for the circuit (including circuit-l. …

Zustand: As New. Unread book in perfect condition.

Zustand: As New. Unread book in perfect condition.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Doctoral Thesis / Dissertation from the year 2018 in the subject Computer Science - Applied, grade: 6, Anna University, course: PhD, language: English, abstract: Test data compression is an effective method for reducing test data volume and memory requirement with relatively small cost. An effective test structure for embedded hard cores is easy to implement and it is also capable of producing high-quality tests as part of the design flow.The purpose of Test data compression intends to reduce Test data volume by using Test Stimulus Compression such as Code-based schemes, Linear-decompression-based schemes and Broadcast-scan-based schemes.The research work addresses the problem of the test data volume and memory requirements. The primary objective of this study is to introduce novel techniques that improve the compression ratio by reducing test data volume during at-speed test in scan designs. This in turn diminishes the tester memory requirement and hence chip area is reduced for Built-in-Self Test environment.The aim of this research is to introduce various compression algorithms by combining the existing data compression techniques. The algorithms are designed to reduce the volume of test patterns of input that is essential to guarantee an acceptable level of fault coverage which is a key parameter to evaluate the quality of testing.…

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. pp. xi + 220 Illus.

Paperback. Zustand: Brand New. 2013 edition. 396 pages. 9.50x6.25x1.00 inches. In Stock.

Paperback. Zustand: Brand New. 2012 edition. 400 pages. 9.25x6.25x0.80 inches. In Stock.

Zustand: New. pp. xi + 220.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.…

Zustand: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

John Wiley & Sons, New York, 1987. XIII, 354 pages with some graphics, cloth cover in dust jacket, (former library book)--- 654 Gramm.

Taschenbuch. Zustand: Neu. VLSI IMPLEMENTATION OF BUILT IN SELF-TEST | M. Fatima (u. a.) | Taschenbuch | Englisch | 2025 | LAP LAMBERT Academic Publishing | EAN 9786207807802 | Verantwortliche Person für die EU: SIA OmniScriptum Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu. …

Taschenbuch. Zustand: Neu. Efficient Test Data Compression and Fault Analysis in VLSI Circuits | Test Data Compression and Decompression Using Efficient Bitmask and Dictionary Selection Method | Sivaganesan Subramaniam | Taschenbuch | 84 S. | Englisch | 2019 | Scholars' Press | EAN 9786138834304 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

8° , Hardcover/Pappeinband. Zustand: Sehr gut. XII, 148 Seiten. Mit Illustrationen. Ausgetragenes Bibliotheksexemplar mit Inventaraufkleber auf Rücken und Vorsatz. Leihkarte in Tasche am Nachsatz. In sehr gutem Zustand. DE-10-19e Sprache: Englisch Gewicht in Gramm: 435.

Zustand: New.

Taschenbuch. Zustand: Neu. VLSI Design and Test | 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings | Manoj Singh Gaur (u. a.) | Taschenbuch | Communications in Computer and Information Science | xvi | Englisch | 2013 | Springer | EAN 9783642420238 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Zustand: New.