Defects silicon (53 Ergebnisse)

Soft cover. Zustand: Very Good. ORIGINAL 1975 PUBLICATION; Softcover; paper clip stain on cover page; o/w in very good condition. Book.

Zustand: New. In English.

Zustand: Very Good. Nice clean bright tight book 215 pages.

Taschenbuch. Zustand: Neu. Neuware - A three-dimensional Positron Annihilation Spectroscopy System (3DPASS) capable to simultaneously measure three-dimensional electron-positron (e--e+) momentum densities measuring photons derived from e--e+ annihilation events was designed and characterized. 3DPASS simultaneously collects a single data set of correlated energies and positions for two coincident annihilation photons using solid-state double-sided strip detectors (DSSD). Positions of photons were determined using an interpolation method which measures a figure-of-merit proportional to the areas of transient charges induced on both charge collection strips directly adjacent to the charge collection strips interacting with the annihilation photons. The subpixel resolution was measured for both double-sided strip detectors (DSSD) and quantified using a new method modeled after a Gaussian point-spread function with a circular aperture.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.…

Paperback. Zustand: Brand New. 80 pages. 8.66x5.98x0.71 inches. In Stock.

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. In English.

Softcover. Zustand: Gut. C-02446 Ex-library with Stamp and Library-Signature in Good Condition, Some Traces of Use 9784431557999 Sprache: Englisch Gewicht in Gramm: 1050.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Taschenbuch. Zustand: Neu. The main defects of silicon carbide ingots and epitaxial layers | Topical review | Yuri Tairov (u. a.) | Taschenbuch | 80 S. | Englisch | 2016 | LAP Lambert Academic Publishing | EAN 9783659836213 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. …

Paperback. Zustand: Brand New. 518 pages. 10.50x7.75x1.17 inches. In Stock.

Zustand: New.

Taschenbuch. Zustand: Neu. Neuware - The Office of Scientific & Technical Information (OSTI), is a part of the U.S. Department of Energy (DOE) that houses research and development results from projects funded by the DOE. The information is generally an article, technical document, conference paper or dissertation. This is one of those publications.…

Zustand: New. KlappentextrnrnThe Office of Scientific & Technical Information (OSTI), is a part of the U.S. Department of Energy (DOE) that houses research and development results from projects funded by the DOE. The information is generally an article, tech.

Taschenbuch. Zustand: Neu. Fluorine enriched silicon: properties and advantages | Interaction between point defects, fluorine and boron atoms in crystalline silicon | Giuliana Impellizzeri | Taschenbuch | 120 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783843374088 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book emphasizesthe importance of the fascinating atomistic insights into the defects and theimpurities as well as the dynamic behaviors in silicon materials, which havebecome more directly accessible over the past 20 years. Such progress has beenmade possible by newly developed experimental methods, first principle theories,and computer simulation techniques.The book is aimed at young researchers, scientists, and technicians in related industries. The mainpurposes are to provide readers with 1) the basic physics behind defects insilicon materials, 2) the atomistic modeling as well as the characterizationtechniques related to defects and impurities in silicon materials, and 3) anoverview of the wide range of the research fields involved.…

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Taschenbuch. Zustand: Neu. Origins of Non-Ideal Current-Voltage Characteristics of Si Solar Cells | Analyses of the impact of shunts, breakdown sites, and defects on multicrystalline silicon solar cells | Jan Bauer | Taschenbuch | 108 S. | Englisch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838128658 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Paperback. Zustand: Brand New. 431 pages. 9.21x6.14x0.87 inches. In Stock.

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Taschenbuch. Zustand: Neu. Crystal defects in multicrystalline silicon | Formation and growth of crystal defects in directionally solidified multicrystalline silicon for solar cells | Birgit Ryningen | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2009 | VDM Verlag Dr. Müller | EAN 9783639052329 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. The Silicon Carbide MOS Capacitor | A Study of Defects, Generation Lifetimes, Leakage Currents, and Other Interesting Nonidealities in the Non-equilibrium SiC/SiO2 MOS Capacitor | Matthew Marinella | Taschenbuch | Kartoniert / Broschiert | Englisch | 2008 | VDM Verlag Dr. Müller | EAN 9783639089059 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu. …

Zustand: Used.

hardcover. Zustand: Gut. 575 Seiten; 9783211206874.3 Gewicht in Gramm: 2.

Zustand: New. In English.

Zustand: Used.

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Organic Peracid Etches | Novel chromium-free etching solutions for the delineation of crystalline defects in thin silicon films | Daniel Georg Possner | Taschenbuch | 192 S. | Englisch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838118536 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…