Al hashimi bashir al hashimi bashir (76 Ergebnisse)

Zustand: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Zustand: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Zustand: Good. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524. …

Zustand: Fair. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524. …

Zustand: Good. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524. …

Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

hardcover. Zustand: Very Good. No Dust Jacket. Hard cover with no jacket. Book is in very good condition. Very light wear in a few places at edges and corners. Previous owner's name to FEP. Thin mark vertically down inside of cover. Contents are otherwise clean, bright and tight. J. Used.

Zustand: Used. pp. 220 Illus.

Zustand: Used. pp. 220.

Zustand: New.

Zustand: New.

Zustand: New.

Zustand: New. In English.

Zustand: New.

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This text surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. Series: Frontiers in Electronic Testing. Num Pages: 189 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 297 x 210 x 12. Weight in Grams: 990. . 2003. Hardback. . . . .…

Zustand: New. Addresses the development and validation of co-synthesis techniques that allow an effective design of embedded systems with low energy dissipation. This book provides an overview of a system-level co-design flow, illustrating how system performance is influenced at various steps of the flow including allocation, mapping, and scheduling. Num Pages: 194 pages, biography. BIC Classification: TJFD1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 14. Weight in Grams: 1080. . 2003. Hardback. . . . .…

Gebunden. Zustand: New. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu.

Zustand: New.

Zustand: New.

Hardback. Zustand: New. System-on-Chip (SoC) is believed to represent the next major market for microelectronics, and there is a considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. The field of SoC is broad and expanding and at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum of books, journals, and conference proceedings. This edited book is an attempt to provide a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas. In particular, the book covers the general principles and ideas of designing, validating and testing complex embedded computing systems and their underlying tradeoffs. Twenty-five international research groups have contributed to the book. Each contribution has an up-to-date survey highlighting the key achievements and future trends. To facilitate the understanding of the various topics covered in the book, each chapter has some background covering the basic principles, and extensive list of references. To enhance the book readability, the chapters are grouped into eight parts, each part examining a particular theme of SoC, including system design, embedded software, power management, reconfigurable computing, network-on-chip, verification and test. The book will be of interest to graduate students, designers and managers working in Electronic and Computer engineering.…

Paperback. Zustand: Brand New. 180 pages. 9.25x6.10x0.44 inches. In Stock.

Buch. Zustand: Neu. Power-Constrained Testing of VLSI Circuits | A Guide to the IEEE 1149.4 Test Standard | Bashir M. Al-Hashimi (u. a.) | Buch | Frontiers in Electronic Testing | xi | Englisch | 2003 | Springer US | EAN 9781402072352 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Zustand: Neu. Power-Constrained Testing of VLSI Circuits | A Guide to the IEEE 1149.4 Test Standard | Bashir M. Al-Hashimi (u. a.) | Taschenbuch | Frontiers in Electronic Testing | xi | Englisch | 2010 | Springer US | EAN 9781441953155 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Zustand: New. In English.

Zustand: As New. Unread book in perfect condition.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 264 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Zustand: New. Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This text surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. Series: Frontiers in Electronic Testing. Num Pages: 189 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 297 x 210 x 12. Weight in Grams: 990. . 2003. Hardback. . . . . Books ship from the US and Ireland.…