Electrothermal Analysis of VLSI Systems - Hardcover

Yi-Kan Cheng; Ching-Han Tsai; Chin-Chi Teng; Sung-Mo (Steve) Kang

 
9780792378617: Electrothermal Analysis of VLSI Systems
Hardcover
ISBN 10: 079237861X ISBN 13: 9780792378617
Verlag: Springer, 2000

Inhaltsangabe

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems.
Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).
Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis.
Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2000
Sprache
Englisch
ISBN 10 
079237861X
ISBN 13 
9780792378617
Einband
Gebundene Ausgabe
Anzahl der Seiten
233
Kontakt zum Hersteller
Springer-Verlag GmbH
customerservice@springernature.com

Tiergartenstraße 17
Heidelberg
Baden-Württemberg
69121
Deutschland

Weitere beliebte Ausgaben desselben Titels

9781475773736: Electrothermal Analysis of VLSI Systems

Vorgestellte Ausgabe

ISBN 10:  1475773730 ISBN 13:  9781475773736
Verlag: Springer, 2013
Softcover