Inhaltsangabe
List of Figures. List of Tables. Preface. Acknowledgments. Part I: The Building Blocks. 1. Introduction. 2. Power Analysis for CMOS Circuits. 3. Temperature-Dependent MOS Device Modeling. 4. Thermal Simulation for VLSI Systems. 5. Fast-Timing Electrothermal Simulation. Part II: The Applications. 6. Temperature-Dependent Electromigration Reliability. 7. Temperature-Driven Cell Placement. 8. Temperature Driven Power and Timing Analysis. Index.
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