X ray characterization materials (23 Ergebnisse)

Broschiert. Zustand: Gut. 183 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten Bibliothek und kann die entsprechenden Kennzeichnungen aufweisen (Rückenschild, Instituts-Stempel.); der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 325. …

Zustand: New.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:3540133593. …

Softcover. Zustand: Gut. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-00467 3540133593 Sprache: Englisch Gewicht in Gramm: 550.

Softcover. Zustand: Gut. 186 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 3540133593 Sprache: Englisch Gewicht in Gramm: 550.

Zustand: New. 2018. paperback. . . . . . Books ship from the US and Ireland.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Erstausgabe, 8°, 183 S., mit zahlreichen s/w-Abbildungen, Text: englisch, farbig illustr. original Kartonage (Paperback), Namens- und Datumsvermerk auf der Titelseite, innen leichte papierbedingte Nachdunklung, sonst ein schönes, sauberes Exemplar. Abholung im Ladengeschäft in Frankfurt am Main (Nordend ggü. Musterschule) möglich. Das spart die Portokosten. Pickup at the store in Frankfurt am Main (Nordend, close to Musterschule) is possible. It saves the shipping costs.…

Paperback. Zustand: Brand New. spiral-bound edition. 192 pages. 9.26x6.11x0.45 inches. In Stock.

Zustand: As New. Unread book in perfect condition.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.…

Paperback. Zustand: Brand New. 255 pages. 9.25x6.10x0.54 inches. In Stock.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.…

Zustand: As New. Unread book in perfect condition.

Taschenbuch. Zustand: Neu. High-Z Materials for X-ray Detection | Material Properties and Characterization Techniques | Leonardo Abbene (u. a.) | Taschenbuch | ix | Englisch | 2024 | Springer | EAN 9783031209574 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Hardcover. Zustand: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.…

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field. …

Hardcover. Zustand: Brand New. 255 pages. 9.25x6.10x9.21 inches. In Stock.

Hardcover. Zustand: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02706 9783540434436 Sprache: Englisch Gewicht in Gramm: 550.

Taschenbuch. Zustand: Neu. Anomalous X-Ray Scattering for Materials Characterization | Atomic-Scale Structure Determination | Yoshio Waseda | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2013 | Springer | EAN 9783662146378 | Verantwortliche Person für die EU: Springer Nature Customer Service Center GmbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called 'bulk amorphous alloys', have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.…

Zustand: New. This book is the first one on anomalous X-ray scatteringThis book is the first one on anomalous X-ray scatteringIncludes supplementary material: sn.pub/extrasThe production of multi layered thin films with sufficient reliability is a k.

Paperback. Zustand: Brand New. 232 pages. 9.25x6.10x0.53 inches. In Stock.