Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials. Dieser Artikel ist nicht verfügbar.Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials

Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.