Recent Advances in X-Ray Characterization of Materials-II (Progress in Crystal Growth and Characterization, Band 18) - Hardcover

Inhaltsangabe

X-rays have been used by physicists, chemists, metallurgists, biologists, crystallographers and materials scientists to study a wide range of materials. Consequently, the results of such research are widely scattered throughout a variety of scientific journals of different disciplines. This second volume of Recent Advances in X-ray Characterization of Materials , together with the first volume published in 1987, reviews the scientific literature, presenting the results in a form especially convenient for the scientist seeking information on research in disciplines other than his own.

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