ulsi devices (15 Ergebnisse)

Zustand: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Hardcover. Zustand: Brand New. 1st edition. 110 pages. 9.09x6.00x0.25 inches. In Stock.

Zustand: New. pp. 110.

Zustand: Gut. Zustand: Gut | Seiten: 744 | Sprache: Englisch | Produktart: Bücher | A complete guide to current knowledge and future trends in ULSI devices Ultra-Large-Scale Integration (ULSI), the next generation of semiconductor devices, has become a hot topic of investigation. ULSI Devices provides electrical and electronic engineers, applied physicists, and anyone involved in IC design and process development with a much-needed overview of key technology trends in this area. Edited by two of the foremost authorities on semiconductor device physics, with contributions by some of the best-known researchers in the field, this comprehensive reference examines such major ULSI devices as MOSFET, nonvolatile semiconductor memory (NVSM), and the bipolar transistor, and the improvements these devices offer in power consumption, low-voltage and high-speed operation, and system-on-chip for ULSI applications. Supplemented with introductory material and references for each chapter as well as more than 400 illustrations, coverage includes: * The physics and operational characteristics of the different components * The evolution of device structures the ultimate limitations on device and circuit performance * Device miniaturization and simulation * Issues of reliability and the hot carrier effect * Digital and analog circuit building blocks.

Zustand: New. pp. 400.

Zustand: New. Eishi, H. Ibe, Chief Researcher, Yokohama Research Laboratory, Hitachi, Ltd.Dr.Eishi Hidefumi IBE received his Ph.D degree in Nuclear Engineering from Osaka University, Japan in 1985. His expertise covers a wide area of science, such as elementary particle/.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Hardcover. Zustand: Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.

Taschenbuch. Zustand: Neu. New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices | Zeev Zalevsky (u. a.) | Taschenbuch | Englisch | 2013 | Elsevier Science | EAN 9780323241434 | Verantwortliche Person für die EU: Zeitfracht Medien GmbH, Ferdinand-Jühlke-Str. 7, 99095 Erfurt, produktsicherheit[at]zeitfracht[dot]de | Anbieter: preigu.

Zustand: New. pp. xii + 729 Illus.

Buch. Zustand: Neu. Neuware - This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.\* Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms\* Covers both terrestrial and avionic-level conditions\* Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary\* Written by a widely-recognized authority in soft-errors in electronic devices\* Code samples available for download from the Companion WebsiteThis book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

Gebunden. Zustand: New. the production standard and component chapters is characteristically high (Contemporary Physics, Vol.42, No. 4 2001)C. Y. CHANG, PhD, is a National Chair Professor at the National Chiao Tung University in Hsinchu, Taiwan.S. M. SZE, PhD, is UMC Chair P.

Hardcover. Zustand: Brand New. 1st edition. 729 pages. 9.50x6.50x1.25 inches. In Stock.

Zustand: New. Ultra-large scale integrated (ULSI) circuits are the next generation of semiconductor devices to follow the very large scale integrated (VLSI) circuits. This volume brings together researchers in the field to write a chapter on their own area of expertise. Editor(s): Chang, C.Y.; Sze, Simon M. Num Pages: 744 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 233 x 162 x 39. Weight in Grams: 1220. . 2000. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - Ultrahoch integrierte Schaltkreise (ULSI) - die nächste Schaltkreisgeneration - werden zwar noch nicht industriell eingesetzt, sind aber das Objekt intensiver Forschungsarbeit. Sie versprechen Vorteile im Stromverbrauch, arbeiten bei niedrigerer Spannung und sind schneller. Die Herausgeber dieses Buches haben die bekanntesten Forscher auf dem Gebiet der Schaltkreise gewonnen, um jeweils ein Kapitel zu ihrem eigenen Spezialgebiet zu schreiben. Kompetent und hochaktuell! (01/00).