atomic force microscopy applications (31 Ergebnisse)

Zustand: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:019509204X.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780195092042.

Hardcover. Zustand: Fine. Leichte Rillen / Abschürfungen / Risse / Knicke. This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

Zustand: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Zustand: New. In.

Paperback. Zustand: Brand New. 60 pages. 8.66x5.91x0.14 inches. In Stock.

Taschenbuch. Zustand: Neu. Atomic Force Microscopy Fundamentals and Applications | Vanarajsinh Solanki (u. a.) | Taschenbuch | 60 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200247247 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Zustand: New. In.

Zustand: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,700grams, ISBN:9781489939319.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 284 | Sprache: Englisch | Produktart: Bücher | This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed.

Zustand: New. In.

Taschenbuch. Zustand: Neu. Neuware - The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requirements for AFM measurements is the quantification of both in-plane and out-of-plane forces acting between the tip and the sample. In this book the procedure for calibration and the various factors to consider when undertaking such studies is outlined with a focus on force-versus-distance and frictional measurements. Examples of surface property analyses, based on the quantification of forces, are shown, with examples ranging from living animal cells to polymeric materials. This book is designed for researchers and students who are interested in carrying out nano scale force measurements in the biological, physical and chemical sciences on a range of systems.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is intended for scientists and engineers in the field of micro- and nano electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is intended for scientists and engineers in the field of micro- and nano electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.

Zustand: New. In.

Hardcover. Zustand: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. In.

Zustand: New. In.

Hardcover. Zustand: Brand New. 1st edition. 520 pages. 9.50x6.50x1.25 inches. In Stock.

Zustand: New. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Series: Oxford Series in Optical & Imaging Sciences. Num Pages: 288 pages, halftones, line drawings, tables. BIC Classification: PDND; PHV. Category: (P) Professional & Vocational. Dimension: 242 x 161 x 21. Weight in Grams: 667. . 1994. Revised. hardcover. . . . . Books ship from the US and Ireland.

Gebunden. Zustand: New. The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the devel.

Zustand: New. This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). Num Pages: 488 pages, Illustrations. BIC Classification: PDND; TBN; TG. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 29. Weight in Grams: 834. . 2012. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

Paperback. Zustand: Brand New. 408 pages. 9.10x6.00x0.90 inches. In Stock.

Zustand: New. Explains the basic technical knowledge needed to use AFM and demonstrates its multifarious uses in biomedicine and the life sciences. The applications range from morphostructural analyses of cellular structures, to the investigation of subcellular structures, to functional investigations, and reveal a way of looking at biological samples. Editor(s): Braga, Pier Carlo; Ricci, Davide. Series: Methods in Molecular Biology. Num Pages: 394 pages, biography. BIC Classification: MF; PDND. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 23. Weight in Grams: 1660. . 2003. 2004th Edition. Hardcover. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware.

Buch. Zustand: Neu. Neuware - The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called 'far-field microscopes' because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).

Zustand: Used: Like New. LIVRE A L?ETAT DE NEUF. EXPEDIE SOUS 3 JOURS OUVRES. NUMERO DE SUIVI COMMUNIQUE AVANT ENVOI, EMBALLAGE RENFORCE. EAN:9781536134957.

Taschenbuch. Zustand: Neu. The Road Toward Molecular Electronics Applications | Correlation between Structural, Mechanical, and Charge Transport Properties of Molecular Monolayers and Surfaces Studied by Atomic Force Microscopy | Yabing Qi | Taschenbuch | Deutsch | VDM Verlag Dr. Müller | EAN 9783639133837 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Zustand: Used.

Zustand: Used.