Verwandte Artikel zu Atomic Force Microscopy Fundamentals and Applications

Atomic Force Microscopy Fundamentals and Applications - Softcover

Solanki, Dr. Vanarajsinh; Dasadiya, Dr. Abhay; Mishra, Dr. Pramita

 
9786200247247: Atomic Force Microscopy Fundamentals and Applications

Inhaltsangabe

This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano –meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Über die Autorin bzw. den Autor

Dr. Vanaraj Solanki had earned his master(M.Sc) in physics (2008) from S. P. University, VVNagar, and Ph.D from Institute of Physics, Bhubaneswar, India. He has also worked at Materials Research Centre, Indian Institute of Science, Bangalore, during his postdoc. Presently, Dr. Solanki is working as a Research Scientist at, KRADLE, CHARUSAT, Changa.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.