9789048178551 - cmos sram circuit design and parametric test in nano-scaled technologies: process-aware sram design and test (frontiers in electronic testing, band 40) von pavlov, andrei (2 Ergebnisse)

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach t…