Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 98,78
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In den WarenkorbZustand: Used. pp. 778.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 93,64
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In den WarenkorbZustand: New. In.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: Used. pp. 778.
EUR 104,18
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In den WarenkorbGebunden. Zustand: New. 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction .
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 153,67
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In den WarenkorbHardcover. Zustand: Brand New. 784 pages. 10.25x7.00x1.75 inches. In Stock.
Sprache: Englisch
Verlag: Springer Nature B.V. Okt 1994, 1994
ISBN 10: 0306449013 ISBN 13: 9780306449017
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.