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Advances in X-Ray Analysis: Volume 37: Vol.37 (Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,) - Hardcover
Inhaltsangabe
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
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Reseña del editor
Selected papers from the 1993 Denver Conference on Applications of X-Ray Analysis. International experts present the latest research in the field, with special coverage of the impact of personal computers and sophisticated software on the development of X-ray instrumentation and techniques. Annotati
Biografía del autor
Ron Jenkins holds a doctorate from Harvard and a masters in buffoonery from the Ringling Brothers Clown College. His translations of Dario Fo and Hoshua Sobol have been performed at theatres around the country. He is the author of Dario Fo and Franca Rame: Artful Laughter and is the chair and artistic director of the theatre department at Wesleyan University in Connecticut.
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Advances in X-Ray Analysis. Volume 37
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Advances in X-Ray Analysis - A Delicate Balance
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Advances in X-Ray Analysis, Vol. 37
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Advances in X-Ray Analysis, Vol. 37
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Advances in X-ray Analysis
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Gebunden. Zustand: New. 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction . Artikel-Nr. 897688287
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Advances in X-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6: Vol 37
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Hardcover. Zustand: Brand New. 784 pages. 10.25x7.00x1.75 inches. In Stock. Artikel-Nr. x-0306449013
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Advances in X-Ray Analysis
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Buch. Zustand: Neu. Neuware - 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index. Artikel-Nr. 9780306449017
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