Verlag: Plenum Press, 1966
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Zustand: Good. Volume 9. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:
Verlag: Sir Isaac Pitman & Sons, 1961
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Zustand: Good. Volume 4. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,950grams, ISBN:
Verlag: Plenum Press, 1960
Anbieter: NEPO UG, Rüsselsheim am Main, Deutschland
Gebundene Ausgabe. Zustand: Gut. 494 Seiten ex LIbrary Book / aus einer wissenschaftlichen Bibliothek/ Sprache: Deutsch Gewicht in Gramm: 550.
Verlag: Springer 01.04.1980., 1980
ISBN 10: 0306404354 ISBN 13: 9780306404351
Anbieter: NEPO UG, Rüsselsheim am Main, Deutschland
Zustand: Gut. Auflage: 1980. 408 Seiten aus einer Firmenbibliothek im guten bis sehr guten Zustand - Sprache: Englisch Gewicht in Gramm: 550 0,0 x 0,0 x 0,0 cm, Gebundene Ausgabe.
Verlag: Springer US, 2013
ISBN 10: 1468486780 ISBN 13: 9781468486780
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. | Seiten: 516 | Sprache: Englisch | Produktart: Bücher.
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Verlag: Springer US, 2013
ISBN 10: 146848639X ISBN 13: 9781468486391
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Zustand: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. | Seiten: 680 | Sprache: Englisch | Produktart: Bücher.
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Verlag: Springer US, 2012
ISBN 10: 1468486756 ISBN 13: 9781468486759
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to the civilian economy. The problem is compounded by the torrential flow of technical information. Thirty million books are available on technical subjects, the total increasing at the rate of six hundred every day. There are one hundred thousand technical journals. More scientific work has been published in the past ten years than in all preceding recorded history. Scientists and engineers only a few years beyond academic pursuits are already encountering a continuing need for retraining and expansion of their own knowledge. At the same time, the re searchers - scientists, engineers, students - must exhibit bold creative thinking to evolve new technology, to better understand nature's secrets, to conceive new theories, and to reduce old theories to practical utilization. Research in the physical sciences and the engineering sciences provides the ever-flowing spring of knowledge for the investigation of new ideas. Such research is sometimes hindered by classification as 'basic' or 'applied. ' There are many times when a research program has no immediate or ultimate objective and is truly contributing to our reservoir of knowledge - a reservoir which will certainly be tapped in the future.
Verlag: Springer US, 2013
ISBN 10: 1468486330 ISBN 13: 9781468486339
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
Verlag: Springer US, 2012
ISBN 10: 1468474030 ISBN 13: 9781468474039
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.
Verlag: Springer US, 2012
ISBN 10: 1468478370 ISBN 13: 9781468478372
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
Verlag: Springer US, 2012
ISBN 10: 1461360773 ISBN 13: 9781461360773
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, 'Impact of the PC in X-Ray Analysis,' was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed.
Verlag: Springer US, 2012
ISBN 10: 146139998X ISBN 13: 9781461399988
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.
Verlag: Springer US, 2012
ISBN 10: 1461365325 ISBN 13: 9781461365327
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Verlag: Springer US, 2012
ISBN 10: 1461399920 ISBN 13: 9781461399926
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Deane K. Smith Department of Geosciences The Pennsylvania State University Computer automation of x-ray powder diffraction has been one of the dominant topics of this conference for many years. In fact, the first description of such instrumentation dates back to 1967, Rex (1). The modern instruments are considerably more sophisticated than this early unit, but the goals of automation are essentially unchanged. They are to obtain better data at a faster rate with less effort than is possible with manual instrumentation. Indeed 'laziness is the mother of invention. ' The emphasis of most of the papers on automation has been tm-lard hardware-controlling systems and aC,'lieving accurate d values and good intensities for effective phase identification and phase characterization. Tests of good data include successful pattern searching and matching. Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. Intensity accuracy is much harder to test unless a theoretical data set is available. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied. In organizing this plenary session, an attempt was made to focus on applications, especially those which are at the forefront of materials studies. In addition many other applications papers were encouraged with the result that a good variety of such topics are included in the program this year.
Verlag: Springer US, 2011
ISBN 10: 1461337291 ISBN 13: 9781461337294
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a 'diffraction' year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.
Verlag: Springer US, 2011
ISBN 10: 1461294991 ISBN 13: 9781461294993
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.
Verlag: Springer US, 2011
ISBN 10: 1461283035 ISBN 13: 9781461283034
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The continuing success of the Denver X-Ray Conference is, it seems to me, the consequence of three equally important facets of each meeting. These are: 1) the collegial atmosphere and workshops at which experts and novices mix, talk, and informally share information at many levels; 2) the plenary session at which information is presented that intentionally brings new ideas to attendees to broaden the scope of the field; and 3) the traditional sessions in which interesting reports on current research and applications are presented in a timely and professional way. The first and last of these are discussed separately by Paul Predecki and are organized (no small task!) by the entire advisory board. This requires much more than deciding whether yet another workshop on specimen preparation is needed and whom to prevail upon to organize and present it. In fact, few attendees at these workshops ever appreciate the level of effort that Paul and his staff expend to make sure everything comes off smoothly, even when hundreds of copies of handouts need to be whipped off at the last moment, travel problems arise, or unusual audio visual aids are suddenly needed. But my topic here is the second of the three facets listed above - the plenary session. Organizing this falls to a single individual, on the theory that one person can then approach enough others as speakers to put together a unified and yet diverse program of related and interesting review papers.
Verlag: Springer US, 2012
ISBN 10: 1461399955 ISBN 13: 9781461399957
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction. This is a 'fluorescence' year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop ment of practical hardware, and that each presents analytical pos sibilities which can hardly be ignored in the next generation of commercial instrumentation. In other words, these are techniques that many of us shall likely find ourselves using by the end of the decade. The greatest difficulty in selecting the subjects was the need to overlook others, particularly 1) the increasing inter est in 'in-situ' or on-line analytical control, for tagging, identi fication or sorting; and 2) the broad subject of the computeriza tion of instrumentation, with its powerful impact on the design of hardware, and its open invitation to the theorist to create more exact mathematical models of the analytical process, regardless of complexity, in the expectation that programmers will find ways to implement solutions in affordable, dedicated computers.
Verlag: Springer US, 2011
ISBN 10: 146133098X ISBN 13: 9781461330981
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Traditionally the emphasis at each annual Denver X-ray Con ference is placed on a particular aspect of X-ray analysis. The past decade has seen a steady expansion of applications of port able X-ray analyzers and probes in the field, in boreholes and in plant process streams. With this in mind, the main theme of the current conference is field applications of X-ray fluorescence with particular reference to analysis of raw materials such as rocks, ores and coal. The Plenary Session took up this theme with two invited papers reviewing applications of X-ray emission techniques to geochemical, borehole and on-stream analysis, and recent developments in port able instruments for alloy, ore and other analyses. The third paper took us further afield with a review of X-ray spectrochemical analy sis on Mars, the Moon and Earth. It is evident that portable X-ray analyzers are finding more and more applications outside the conventional boundaries of X-ray spectrometry. Users are not analysts and sometimes not even scien tists. Until recently this trend has been hindered by the 'scien tific nature' of the instruments; one needs to understand XRF meth ods in order to properly operate the instrument. Microprocessor technology has made possible the development of precalibrated, 'smart' analyzers with readouts in quantities familiar to the user and interlocks to prevent erroneous operation. Further developments along these lines were reported at this conference.
Verlag: Springer US, 2012
ISBN 10: 1468476351 ISBN 13: 9781468476354
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Verlag: Springer US, 2012
ISBN 10: 1468475371 ISBN 13: 9781468475371
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and new methods of great power are being developed. These developments are occurring in each of the fields covered, as may readily be seen by a glance at this twelfth volume and other recent volumes of this series. It seems clear that the policy of having these conferences and these volumes cover a wide field rather than a single one such as, for example, structure determination, or fluorescence analysis, is a policy that meets with general approval and should be continued. I understand there is every intention to do so. C. S. Barrett It is customary to acknowledge in each volume the invited session chairmen of the three-day meeting. They and the sessions at which they presided (21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND DIFFRACTION. C. S. Barrett, University of Chicago, Chicago, Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen, Massachusetts Institute of Technology, Cambridge, Massachusetts.
Verlag: Springer US, 2013
ISBN 10: 1461399777 ISBN 13: 9781461399773
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi ders the problem of sampling. If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear ly to the difficulty of obtaining 'representative' samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.
Verlag: Springer US, 2011
ISBN 10: 1461297133 ISBN 13: 9781461297130
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver and were eventually brought to fruition by a jOint organizing committee consisting of: O. P. Anderson, Colorado State University (ACA) , D. E. Leyden, Colorado State University (DC), R. D. Witters, Colorado School of Mines (ACA) and P. K. Predecki (DC). We take this opportunity to thank the committee members and the early planners for their vision, ingenuity and hard work without which the conference would not have materialized. There was no plenary session in 1983, instead a number of special sessions were organized and chaired by various individuals.
Verlag: Springer US, 2012
ISBN 10: 1461399718 ISBN 13: 9781461399711
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single io.ns. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
Verlag: Springer US, 2012
ISBN 10: 1461399831 ISBN 13: 9781461399834
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the growth and improvement of the data collection available as reference standards. In recent years some attempts have been made to use the method to a greater extent by furnishing results on a quantitative basis. This has proved to be difficult because of the problem of comparing the relative intensities of the diffraction peaks from one phase to another. This year the initial session of invited papers focuses primarily on this problem. The subject is approached both by the use of internal comparison standards and by calculation of intensities. In addition, the identification of crystalline phases by X-ray diffraction of single crystals is discussed in an invited paper. This method, with its advantages of the use of very small samples, is becoming increasingly feasible because of the development of simple equipment and the avail ability of a growing data bank. Other X-ray diffraction developments discussed at the Conference include stress analysis, use of computers for searching the JCPDS powder diffraction file, texture analysis, and applications to specific fields. Spectroscopy topics covered at the conference included a discussion of methods of concentration of materials for fluorescence analysis, soft X-ray spectra, and equipment for fluorescence analysis.
Verlag: Springer US, 2011
ISBN 10: 1461290759 ISBN 13: 9781461290759
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 35th Annual Denver Conference on Applications of X-Ray Analysis was held August 4-8, 1986, on the campus of the University of Denver. Since the previous year's conference had emphasized x-ray diffraction, this year the Plenary Session spotlighted x-ray fluorescence, with the title 'Trends in XRF: A World Perspective,' featuring renowned speakers from three major areas. XRF IN NORTH AMERICA, by Prof. D. E. Leydon, from Colorado State University, dealt specifically with developments in the fields of instrumentation, data treatment and applications in that part of the world. Prof. H. Ebel, from the Technical University of Vienna, discussed XRF IN EUROPE, concentrating on subjects including total reflection, improved fundamental parameters, quantitation without standards and imaging techniques. Tomoya Arai, of the Rigaku Industrial Corporation in Japan, in considering XRF IN THE FAR EAST, described the scientific activity in XRF and the applications thereof, primarily in Japan and China. These plenary lectures were interspersed with short discussions of PERSONAL OBSERVATIONS on the subject by the co-chairmen of the SeSSion, Ron Jenkins and myself. The intent of this session was to bring the audience up-to-date on the status of the field in various parts of the world, and to give some feeling concerning where it is likely to go in the immediate future. Hopefully, the publication of the written versions of those presentations in this volume will make the authors' thoughts available to many who could not be present at the conference.
Verlag: Springer US, 2012
ISBN 10: 1461362938 ISBN 13: 9781461362937
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these 'leading-edge' developments, the topic for the Plenary Session was 'Grazing-Incidence X Ray Characterization of Materials. ' The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on 'Grazing Incidence X-Ray Scattering from Thin Films. ' He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on 'Grazing Incidence Diffuse X-Ray Scattering from Thin Films. ' He concentrated on the use of newly developed 'off-specular' reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.
Libro vintage in-8°, cartonato di pagg. 579, New York 1984. Conferenza, Colorado 1-5 agosto 1983. Testo in lingua inglese. Titolo impresso sul dorso e sul piatto. Sovraccoperta illustrata. Illustrazioni in bn all'interno e fuori dal testo. Prefazione di Paul Predecki. Usura da scaffale. Ordinario segno del tempo.
Libro vintage, in-8°, pagg 704, Plenum Press New York 1990. Proceedings of the Thirty-eighth Annual Conference on Applications of X-Ray Analysis, held July 31 - August 4, 1989 in Denver, Colorado. Titolo impresso sul dorso e sul piatto. Sovraccoperta illustrata in bn. Impercettibile segno del tempo.
Verlag: Springer US, 2013
ISBN 10: 1468486365 ISBN 13: 9781468486360
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Ninth Annual Conference on Applications of X-Ray Anal ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado. Forty one papers on new developments in X-ray analytical techniques and instrumentation were presented. This volume contains thirty eight of those papers. Research in X-ray analytical methods is a dynamic and expanding area of scientific investigation. Each year exciting and stimulating progress is reported in the various regions of this field. Suitable documentation of the results is the purpose of the series 'Advances in X-Ray Analysis. ' Participation in the Conference by two distinguished European scientists, Dr. Raymond Castaing of the University of Paris, France, and Dr. Arnold Hargreaves of the Manchester College of Science and Technology, England, was made possible through financial aid provided by the United States Office of Naval Re search. This assistance is greatly appreciated. Major contributions to the conference were made by the following individuals who chaired the technical sessions: Dr. William D. Forgeng, Electro Metallurgical Company, Niagara Falls, New York Dr. Kurt F. J. Heinrich, E. I. du Pont de Nemours and Company, Wilmington, Delaware Mr. Robert A. McCune, University of Denver, Denver, Colorado Dr. Dan McLachlan, Jr. , Stanford Research Institute, Menlo Park, California Dr. William H. Robinson, Carnegie Institute of Technology, Pittsburgh, Pennsylvania Dr.