Paperback. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
Sprache: Englisch
Verlag: Amer Society of Agricultural and, 1750
ISBN 10: 0929355946 ISBN 13: 9780929355948
Anbieter: ThriftBooksVintage, Tukwila, WA, USA
Hardcover. Zustand: Very Good. No Jacket. Minor shelf and handling wear, overall a clean solid copy with minimal signs of use. An excellent copy, gently worn; Pages free of markings; Secure packaging for safe delivery.
Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Deutschland
xii, 263 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
EUR 53,40
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In den WarenkorbZustand: New. pp. 1334.
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 60,51
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In den WarenkorbZustand: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
Zustand: Very Good. 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 93,46
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In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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Taschenbuch. Zustand: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. Advances in X-Ray Analysis | Volume 36 | John V. Gilfrich (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2012 | Springer US | EAN 9781461362937 | Verantwortliche Person für die EU: Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Sprache: Englisch
Verlag: Springer US, Springer New York, 2012
ISBN 10: 1461362938 ISBN 13: 9781461362937
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these 'leading-edge' developments, the topic for the Plenary Session was 'Grazing-Incidence X Ray Characterization of Materials. ' The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on 'Grazing Incidence X-Ray Scattering from Thin Films. ' He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on 'Grazing Incidence Diffuse X-Ray Scattering from Thin Films. ' He concentrated on the use of newly developed 'off-specular' reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.
Sprache: Englisch
Verlag: Amer Society of Agricultural and, 1998
ISBN 10: 0929355946 ISBN 13: 9780929355948
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 325 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 141,16
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In den WarenkorbZustand: Used. pp. xii + 263 93 Illus. (67 Col.).
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: Used. pp. xii + 263.
EUR 104,18
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In den WarenkorbGebunden. Zustand: New. Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). X.
EUR 104,18
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In den WarenkorbGebunden. Zustand: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
Zustand: Good. 710 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
EUR 149,30
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In den WarenkorbHardcover. Zustand: Brand New. 712 pages. 10.50x7.50x1.50 inches. In Stock.
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 164,21
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In den WarenkorbZustand: New. In.
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EUR 164,21
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In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 164,21
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In den WarenkorbZustand: New. In.
Anbieter: moluna, Greven, Deutschland
EUR 136,16
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In den WarenkorbGebunden. Zustand: New.
Buch. Zustand: Neu. Neuware - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.