Osamu ueda (38 Ergebnisse)

First Edition. First edition. Hardcover. First printing. 503 pages. Foreword by James n. Wood. Essays by Donald Jenkins, Timothy T. Clark, Osamu Ueda and Naomi Noble Richards. Includes 136 color and numerous black and white illustrations. A close to near fine copy with some waviness to the pages from improper storage in a near fine dust jacket. A solid copy of this terrific book. This is a heavy and oversized book and will require extra shipping.…

Tankobon Hardcover. Zustand: Brand New. Japanese language. 7.24x4.33x0.63 inches. In Stock.

Tankobon Softcover. Zustand: Brand New. Japanese language. 7.40x5.20x0.59 inches. In Stock.

Hardcover. Zustand: Good. Original red cloth, gilt lettered spine, dust jacket, numerous (full page) illustrations in colour and b/w, 4to.

Hardcover. Zustand: As New. Zustand des Schutzumschlags: As New. First Edition. 503pp. First Printing. (AIC and Princeton conventions designate first printing by not stating subsequent printings). Red cloth, gold stamp on spine. Size: 4to - over 9¾" - 12" tall.

Hardcover. Zustand: Good. Zustand des Schutzumschlags: Good. 1st Edition. Large 4to. 503pp. Color frontispiece. Numerous illus., many in color. Original cloth, slightly worn, and the binding slightly weak. Dust jacket.

Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. pp. xiii + 195 137 Illus.

Zustand: New. pp. xiii + 195.

Hardcover. Zustand: vg. First edition. 4to. 504pp. Naomi Noble Richard, Editor. Ruby cloth in original dj. Profusely illustrated with b/w and color annotated drawings. In near fine condition.

Lex.-8°, Hardcover. Zustand: Wie neu. 504 Seiten Wie neu, noch eingeschweisst. Sprache: Englisch Gewicht in Gramm: 2602.

hardcover. Zustand: New. In shrink wrap. Looks like an interesting title.

Zustand: As New. Unread book in perfect condition.

Zustand: New.

Zustand: New.

Hardback. Zustand: New. Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.…

Zustand: New. &Uumlber den AutorOsamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of.

Hardcover. Zustand: gut. 2012. This book covers reliability procedures for lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Addresses reliability engineering, materials, reliability testing and electronic characterization.Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms. Content: Preface Part 1: Materials Issues and Reliability of Optical Devices 1. Reliability Testing of Semiconductor Optical Devices 2. Failure Analysis of Semiconductor Optical Devices 3. Failure Analysis using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication 4. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation 5. Catastrophic Optical-damage in High Power, Broad-Area Laser-diodes 6. Reliability and Degradation of Vertical Cavity Surface Emitting Lasers 7. Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes 8. InGaN Laser Diode Degradation 9. Radiation-enhanced Dislocation Glide - The Current Status of Research 10. Mechanism of Defect Reactions in Semiconductors Part 2: Materials Issues and Reliability of Electron Devices 11. Reliability Studies in the Real World 12. Strain Effects in AlGaN/GaN HEMTs 13. Reliability Issues in AlGaN/GaN High Electron Mobility Transistors 14. GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors 15. Novel Dielectrics for GaN Device Passivation And Improved Reliability 16. Reliability Simulation 17. The Analysis of Wide Bandgap Semiconductors Using Raman Spectroscopy 18. Reliability Study of InP-Based HBTs Operating at High Current Density Index Zusatzinfo 30 Tables, black and white; XVI, 616 p. Verlagsort New York, NY Sprache englisch Maße 155 x 235 mm Naturwissenschaften Physik Astronomie Optik Techniker Elektrotechnik Energietechnik Technik Maschinenbau Devices failure analysis Devices reliability Electrical devices degradation failure Electronic device reliability Materials reliability book Optical devices degradation failure Semiconductor devices failure Semiconductor Optical Devices, Reliability Testing ISBN-10 1-4614-4336-9 1461443369 ISBN-13 978-1-4614-4336-0 9781461443360 In englischer Sprache. 616 pages. 155 x 235 mm.…

Hardcover. Zustand: gut. 1994. The Actor's Image: Print Makers of the Katsukawa School In englischer Sprache. pages.

Taschenbuch. Zustand: Neu. Reliability of Semiconductor Lasers and Optoelectronic Devices | Robert Herrick (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2021 | Woodhead Publishing | EAN 9780128192542 | Verantwortliche Person für die EU: Elsevier B.V., Radarweg 29, 1043 NX AMSTERDAM, NIEDERLANDE, productsafety[at]elsevier[dot]com | Anbieter: preigu.…

Zustand: New.

Buch. Zustand: Neu. Neuware - Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.…

Zustand: As New. Unread book in perfect condition.

Hardback. Zustand: New. Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.…

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 372 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Taschenbuch. Zustand: Neu. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices | Osamu Ueda (u. a.) | Taschenbuch | xvi | Englisch | 2014 | Springer | EAN 9781493901197 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Zustand: New.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.…

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.…