nan yao (28 Ergebnisse)

Paperback. Zustand: Fair. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.

Paperback. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1300grams, ISBN:9781402080036.

Couverture rigide. Zustand: Satisfaisant. Editions En Langues Étrangères - Beijing - Pékin, 1957. 1 volume relié(s) format In-8 assez bon.

Hardcover. Zustand: Very Good. No Jacket. Tight binding, clean interior. Maroon boards in great shape with silver lettering; minor bumps to corners; slight rubbing to text on front. Previous owner stamp on ffep, interior otherwise unmarked. 255 pages including appendix, references, computer programs and index.

Paperback. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. In.

Zustand: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, black & white illustrations. BIC Classification: TBN; TGM; TJFD5. Category: (P) Professional & Vocational. Dimension: 246 x 169 x 24. Weight in Grams: 668. . 2011. Reissue. paperback. . . . . Books ship from the US and Ireland.

Paperback. Zustand: Brand New. 132 pages. 8.66x5.91x0.30 inches. In Stock.

Zustand: New. In.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: New.

Zustand: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, 196 b/w illus. BIC Classification: TBN; TGM; TJF. Category: (P) Professional & Vocational. Dimension: 180 x 252 x 29. Weight in Grams: 862. . 2007. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.

Hardcover. Zustand: Brand New. 1st edition. 395 pages. 9.75x7.00x1.00 inches. In Stock.

Zustand: New. In.

Zustand: NEW.

Zustand: New. pp. xx + 742 Illus.

Hardcover. Zustand: Brand New. 408 pages. 9.00x6.00x0.91 inches. In Stock.

Zustand: New. In.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 768 | Sprache: Englisch | Produktart: Bücher | Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

Zustand: New. 2023. hardcover. . . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - The Formosan subterranean termite, Coptotermes formosanus, is the most destructive and invasive termite species globally. It is also the only termite species listed in the world's 100 worst invasive alien species of the Global Invasive Species Database. Annually, its infestation costs more than $4 billion in control and damage repairs in the USA alone.This book is the first comprehensive resource drawing on all the literature on C. formosanus since Tokuichi Shiraki first described the species in 1909. The book covers the worldwide distribution of this species, its biogeography, and how it has dispersed from its native range in southern China and Taiwan to different parts of the world. It describes its present taxonomic status and discusses the species' biology, ecology, foraging behavior, physiology, chemical ecology and its association with symbionts. From a practical standpoint, the authors address all of the various management options for this species, such as baits, soil termiticides, wood preservatives, inspection and detection technologies, and Integrated Pest Management (IPM) approaches. Lastly, there are chapters dedicated to another important destructive species, Coptotermes gestroi (the Asian subterranean termite), and the recently discovered C. formosanus/C. gestroi hybrids.This important book is an essential and valuable reference for researchers, graduate students, pest management professionals, chemical manufacturer personnel, building and property managers, and others. It provides readers with a comprehensive understanding of the biology and management of the Formosan subterranean termite and the Asian subterranean termite.

Buch. Zustand: Neu. Biology and Management of the Formosan Subterranean Termite and Related Species | Chow-Yang Lee (u. a.) | Buch | Einband - fest (Hardcover) | Englisch | 2023 | CABI Publishing | EAN 9781800621572 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Hardcover. Zustand: Brand New. 1st edition. 731 pages. 9.25x6.25x1.50 inches. In Stock.

Paperback. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.