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In den WarenkorbZustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
Sprache: Englisch
Verlag: Cambridge University Press, 2009
ISBN 10: 0521857481 ISBN 13: 9780521857482
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Sprache: Englisch
Verlag: Kluwer Academic Publishers, Boston, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Anbieter: PsychoBabel & Skoob Books, Didcot, Vereinigtes Königreich
EUR 17,50
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In den Warenkorbhardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. Name from previous owner on FEP. No dust jacket. Binding is very well preserved, though with light surface wear to covers. Pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used.
Sprache: Englisch
Verlag: Kluwer Academic Publishers, Boston, MA, U. S. A., 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Anbieter: PsychoBabel & Skoob Books, Didcot, Vereinigtes Königreich
Erstausgabe
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In den Warenkorbhardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. First Edition. Printed boards, no jacket. Exterior a little worn, grubby; previous owner's name on FEP; contents otherwise clean, sound, bright. TPW. Used.
Sprache: Englisch
Verlag: Cambridge University Press, 2009
ISBN 10: 0521857481 ISBN 13: 9780521857482
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
Hardcover. Zustand: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Sprache: Englisch
Verlag: Kluwer Academic Publishers, Boston, 1998
ISBN 10: 0792380738 ISBN 13: 9780792380733
Anbieter: PsychoBabel & Skoob Books, Didcot, Vereinigtes Königreich
EUR 48,69
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In den WarenkorbHardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. Hardcover. No jacket. A few marks on boards. Leading corners are slightly worn. Minor dent on upper edge of rear board. Spine ends are a little bumped. Previous owner's name penned on FEP. Binding is tight, contents are clean and clear throughout. AM. Used.
hardcover. Zustand: Sehr gut. 194 Seiten; 9780792380733.2 Gewicht in Gramm: 1.
Sprache: Englisch
Verlag: Cambridge University Press, 2009
ISBN 10: 0521857481 ISBN 13: 9780521857482
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 260 | Sprache: Englisch | Produktart: Bücher | In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | High-Level Power Analysis and Optimization presents a comprehensive description of power analysis and optimization techniques at the higher (architecture and behavior) levels of the design hierarchy, which are often the levels that yield the most power savings. This book describes power estimation and optimization techniques for use during high-level (behavioral synthesis), as well as for designs expressed at the register-transfer or architecture level. High-Level Power Analysis and Optimization surveys the state-of-the-art research on the following topics: power estimation/macromodeling techniques for architecture-level designs, high-level power management techniques, and high-level synthesis optimizations for low power. High-Level Power Analysis and Optimization will be very useful reading for students, researchers, designers, design methodology developers, and EDA tool developers who are interested in low-power VLSI design or high-level design methodologies.
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Sprache: Englisch
Verlag: Cambridge University Press, 2009
ISBN 10: 0521857481 ISBN 13: 9780521857482
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In den WarenkorbZustand: Used. pp. xii + 617 Illus.
Sprache: Englisch
Verlag: Cambridge University Press, 2009
ISBN 10: 0521857481 ISBN 13: 9780521857482
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: Used. pp. xii + 617.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, 2004
ISBN 10: 354022906X ISBN 13: 9783540229063
Anbieter: moluna, Greven, Deutschland
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Taschenbuch. Zustand: Neu. Nanoelectronic Circuit Design | Niraj K. Jha (u. a.) | Taschenbuch | xi | Englisch | 2014 | Springer | EAN 9781489981530 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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Sprache: Englisch
Verlag: Springer-Verlag New York Inc, 2004
ISBN 10: 354022906X ISBN 13: 9783540229063
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In den WarenkorbPaperback. Zustand: Brand New. 1st edition. 1116 pages. German language. 9.25x6.25x1.25 inches. In Stock.
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Sprache: Englisch
Verlag: Springer US, Springer New York, 2014
ISBN 10: 1489981535 ISBN 13: 9781489981530
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is about large-scale electronic circuits design driven by nanotechnology, where nanotechnology is broadly defined as building circuits using nanoscale devices that are either implemented with nanomaterials (e.g., nanotubes or nanowires) or following an unconventional method (e.g., FinFET or III/V compound-based devices). These nanoscale devices have significant potential to revolutionize the fabrication and integration of electronic systems and scale beyond the perceived scaling limitations of traditional CMOS.While innovations in nanotechnology originate at the individual device level, realizing the true impact of electronic systems demands that these device-level capabilities be translated into system-level benefits. This is the first book to focus on nanoscale circuits and their design issues, bridging the existing gap between nanodevice research and nanosystem design.
Taschenbuch. Zustand: Neu. Testing and Reliable Design of CMOS Circuits | Niraj K. Jha (u. a.) | Taschenbuch | xiv | Englisch | 2011 | Springer | EAN 9781461288183 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer, Berlin, Springer, 2004
ISBN 10: 354022906X ISBN 13: 9783540229063
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Neuware - Welcome to the proceedings of the 2004 International Conference on Embedded and Ubiquitous Computing (EUC 2004) which was held in Aizu-Wakamatsu City, Japan, 25-27 August 2004. Embedded and ubiquitous computing are emerging rapidly as exciting new paradigms and disciplines to provide computing and communication services all the time, everywhere. Its systems are now invading every aspect of life to the point that they are disappearing inside all sorts of appliances or can be worn unobtrusively as part of clothing and jewelry, etc. This emergence is a natural outcome of research and technological advances in embedded systems, pervasive computing and communications, wireless networks, mobile computing, distri- ted computing and agent technologies, etc. Its explosive impact on academia, industry, government and daily life can be compared to that of electric motors over the past century but promises to revolutionize life much more profoundly than elevators, electric motors or even personal computer evolution ever did. The EUC 2004 conference provided a forum for engineers and scientists in academia, industry, and government to address all the resulting profound ch- lenges including technical, safety, social, legal, political, and economic issues, and to present and discuss their ideas, results, work in progress and experience on all aspects of embedded and ubiquitous computing. There was a very large number of paper submissions (260) from more than 20countriesandregions,includingnotonlyAsiaandthePaci c,butalsoEurope and North America. All submissions were reviewed by at least three program or technical committee members or external reviewers.
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 485 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is about large-scale electronic circuits design driven by nanotechnology, where nanotechnology is broadly defined as building circuits using nanoscale devices that are either implemented with nanomaterials (e.g., nanotubes or nanowires) or following an unconventional method (e.g., FinFET or III/V compound-based devices). These nanoscale devices have significant potential to revolutionize the fabrication and integration of electronic systems and scale beyond the perceived scaling limitations of traditional CMOS.While innovations in nanotechnology originate at the individual device level, realizing the true impact of electronic systems demands that these device-level capabilities be translated into system-level benefits. This is the first book to focus on nanoscale circuits and their design issues, bridging the existing gap between nanodevice research and nanosystem design.