Hnatek eugene (34 Ergebnisse)

Zustand: Good. Good condition. Good dust jacket. 2nd edition. A copy that has been read but remains intact. May contain markings such as bookplates, stamps, limited notes and highlighting, or a few light stains.

Zustand: Good. Good condition. Acceptable dust jacket. Second edition. A copy that has been read but remains intact. May contain markings such as bookplates, stamps, limited notes and highlighting, or a few light stains.

Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Very Good. No Jacket. Former library book; Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Zustand: Good. 2nd. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Hardcover. Zustand: Good. Zustand des Schutzumschlags: Fair. 2nd Edition. Paperback in good condition. Jacket has some sticker residue to left corner and small rip on bottom of spine. Black cloth board cover in very good condition. Inside pages are all clean and birght.

Paperback. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Paperback. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,850grams, ISBN.

Paperback. Zustand: Very Good. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.

Hardcover. Zustand: Good. Zustand des Schutzumschlags: Good. Foxing to exterior edge of pages. - Good overall condition. General wear. No major blemishes. No writing. ; - We're committed to your satisfaction. We offer free returns and respond promptly to all inquiries. Your item will be carefully wrapped in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence.…

Couverture rigide. Zustand: Bon. petit cachet de propriétaire en page de titre.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: New. In English.

Zustand: Fine. *Price HAS BEEN REDUCED by 10% until Monday, Oct. 12 (weekend sale item)* xiii, 698 pp., hardcover, fine. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.…

Buch. Zustand: Neu. Neuware - Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a.…

Buch. Zustand: Neu. Digital Integrated Circuit Testing from a Quality Perspective | Eugene R. Hnatek | Buch | Einband - fest (Hardcover) | Englisch | 1993 | Humana | EAN 9780442006433 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu. …

Zustand: Gut. Zustand: Gut | Seiten: 808 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Zustand: New.

Zustand: New. In English.

Zustand: Gut. Zustand: Gut | Seiten: 712 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering.

Zustand: New. Hnatek, Eugene R.Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends the s.

Hardcover. Zustand: Brand New. 3rd sub edition. 9.50x6.50x1.25 inches. In Stock.

Zustand: New. Num Pages: 656 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 229 x 152 x 35. Weight in Grams: 1089. . 1989. 3 Rev ed. Hardback. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabrication and assembly; avenues of contamination; IC packaging methods; and, in-line process monitors and test structures.…

Zustand: New. Eugene R. Hnatek is Senior Director of Quality, Qualcomm Incorporated, San Diego, California. The author of 12 books, including Integrated Circuit Quality and Reliability, Second Edition, Revised and Expanded (Marcel Dekker, Inc.), and the author or coautho.