Hardcover. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Zustand: Good. Good condition. Acceptable dust jacket. Second edition. A copy that has been read but remains intact. May contain markings such as bookplates, stamps, limited notes and highlighting, or a few light stains.
Paperback. Zustand: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
EUR 12,03
Anzahl: 1 verfügbar
In den WarenkorbZustand: Very Good. This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
Anbieter: WorldofBooks, Goring-By-Sea, WS, Vereinigtes Königreich
EUR 12,47
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In den WarenkorbHardback. Zustand: Very Good. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.
EUR 3,02
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Dust jacket in good condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1300grams, ISBN:0442234295.
Anbieter: RIVERLEE BOOKS, Waltham Cross, HERTS, Vereinigtes Königreich
EUR 7,23
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Good. Zustand des Schutzumschlags: Fair. 2nd Edition. Paperback in good condition. Jacket has some sticker residue to left corner and small rip on bottom of spine. Black cloth board cover in very good condition. Inside pages are all clean and birght.
EUR 24,15
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
Verlag: John Wiley and Sons, 1975
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
EUR 7,41
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,850grams, ISBN:
Hardcover. Zustand: Good. Zustand des Schutzumschlags: Good. Foxing to exterior edge of pages. - Good overall condition. General wear. No major blemishes. No writing. ; - We're committed to your satisfaction. We offer free returns and respond promptly to all inquiries. Your item will be carefully wrapped in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence.
Anbieter: PBShop.store US, Wood Dale, IL, USA
HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Anbieter: PBShop.store UK, Fairford, GLOS, Vereinigtes Königreich
EUR 95,83
Anzahl: 1 verfügbar
In den WarenkorbHRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 116,82
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. Digital Integrated Circuit Testing from a Quality Perspective | Eugene R. Hnatek | Buch | Einband - fest (Hardcover) | Englisch | 1993 | Humana | EAN 9780442006433 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a.
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Gut. Zustand: Gut | Seiten: 808 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 227,93
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Springer US, Springer Aug 1993, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Anbieter: Books-by-Floh, Paderborn, Deutschland
Buch. Zustand: Neu. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.
Anbieter: moluna, Greven, Deutschland
EUR 234,58
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Hnatek, Eugene R.Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends the s.
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering.
EUR 312,10
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 3rd sub edition. 9.50x6.50x1.25 inches. In Stock.
Sprache: Englisch
Verlag: Kluwer Academic Publishers Group, 1989
ISBN 10: 0442207689 ISBN 13: 9780442207687
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Num Pages: 656 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 229 x 152 x 35. Weight in Grams: 1089. . 1989. 3 Rev ed. Hardback. . . . . Books ship from the US and Ireland.
Sprache: Englisch
Verlag: Taylor & Francis Inc Dez 1994, 1994
ISBN 10: 0824792831 ISBN 13: 9780824792831
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabrication and assembly; avenues of contamination; IC packaging methods; and, in-line process monitors and test structures.
Anbieter: PBShop.store UK, Fairford, GLOS, Vereinigtes Königreich
EUR 391,18
Anzahl: 1 verfügbar
In den WarenkorbHRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Zustand: New. Eugene R. Hnatek is Senior Director of Quality, Qualcomm Incorporated, San Diego, California. The author of 12 books, including Integrated Circuit Quality and Reliability, Second Edition, Revised and Expanded (Marcel Dekker, Inc.), and the author or coautho.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 433,50
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 472 pages. 9.00x6.25x1.25 inches. In Stock.
Sprache: Englisch
Verlag: Taylor & Francis Inc Okt 2002, 2002
ISBN 10: 0824708326 ISBN 13: 9780824708320
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. The author focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.
Anbieter: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Deutschland
EUR 3.459,90
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: gut. 1987. Integrated Circuit Quality and Reliability (Electrical Engineering & Electronics) In englischer Sprache. pages.