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[Defect-oriented Testing for Nano-metric CMOS VLSI Circuits] (By: Manoj Sachdev) [published: February, 2010] - Softcover
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Verlag:
New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
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Softcover
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-9155
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