Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials) - Softcover

Buch 135 von 203: Woodhead Publishing Series in Electronic and Optical Materials

Cho, Yasuo

 
9780128172469: Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)
Softcover
ISBN 10: 0128172460 ISBN 13: 9780128172469
Verlag: Woodhead Publishing, 2020

Inhaltsangabe

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.

The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

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Über die Autorin bzw. den Autor

Yasuo Cho graduated in 1980 from Tohoku University in electrical engineering department. In 1985 he became a research associate at Research Institute of Electrical Communication Tohoku University. In 1990, he received an associate professorship from Yamaguchi University. He then became an associate professor in 1997 and a full professor in 2001 at Research Institute of Electrical Communication Tohoku University. During this time, his main research interests included nonlinear phenomena in ferroelectric materials and their applications, research on the scanning nonlinear dielectric microscopy (SNDM), and research on using the SNDM in next-generation ultrahigh density ferroelectric data storage (SNDM ferroelectric probe memory).

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Verlag
Woodhead Publishing
Erscheinungsdatum
2020
Sprache
Englisch
ISBN 10 
0128172460
ISBN 13 
9780128172469
Einband
Taschenbuch
Auflage
1
Anzahl der Seiten
256
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Zeitfracht Medien GmbH
produktsicherheit@zeitfracht.de

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