Vlsi technology design (37 Ergebnisse)

Contents 1 Introduction to Monolithic Interated Circuit Micro Electronic TEchnology 2 Impurity Introduction and Redistribution 3 MOS Transistor 4 Standard DigitalICs5 Programmable Logic Devices 6 Gallium Arsenide VLSI TEchnology 7 Index.

Zustand: New. pp. 276.

309 S. mit zahlreichen Abbildungen, (309 pp. with a lot of figures), 0879421800 Sprache: Englisch Gewicht in Gramm: 820 Groß 8°, (large 8vo), Original-Pappband (Hardcover), Bibliotheks-Exemplar (Privatbibliothek) mit 2 kleinen Rückenschildern, Stempel auf Titel und auf Schnitt Einband minimal lichtrandig, insgesamt gutes und innen sauberes Exemplar, (library copy in good condition).…

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. In English.

Paperback. Zustand: Brand New. 600 pages. 6.69x1.21x9.61 inches. In Stock.

Paperback. Zustand: Brand New. revised expanded edition. 281 pages. 9.26x6.10x0.60 inches. In Stock.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, held in Singapore, in October 2021\*.The 12 full papers included in this volume were carefully reviewed and selected from the 44 papers (out of 75 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like low-power design of RF, analog and mixed-signal circuits, EDA tools for the synthesis and verification of heterogenous SoCs, accelerators for cryptography and deep learning and on-chip Interconnection system, reliability and testing, and integration of 3D-ICs.\*The conference was held virtually.…

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, held in Singapore, in October 2021\*.The 12 full papers included in this volume were carefully reviewed and selected from the 44 papers (out of 75 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like low-power design of RF, analog and mixed-signal circuits, EDA tools for the synthesis and verification of heterogenous SoCs, accelerators for cryptography and deep learning and on-chip Interconnection system, reliability and testing, and integration of 3D-ICs.\*The conference was held virtually.…

Paperback. Zustand: Brand New. rep rev edition. 240 pages. 9.25x6.10x0.63 inches. In Stock.

Paperback. Zustand: Brand New. 2012 edition. 368 pages. 9.25x6.10x0.76 inches. In Stock.

Zustand: New. Cherry Bhargava, Gaurav Mani KhanalThe current cutting-edge VLSI circuit design technologies provide end-users with many applications, increased processing power and improved cost effectiveness. This trend is accelerating, with significant implic.

Taschenbuch. Zustand: Neu. VLSI Design for Gait Analysis: Challenges and Future Directions | Exploring the Boundaries of Wearable Technology | Sampath Dakshina Murthy Achanta (u. a.) | Taschenbuch | Englisch | 2023 | LAP LAMBERT Academic Publishing | EAN 9786206165026 | Verantwortliche Person für die EU: SIA OmniScriptum Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu.…

Zustand: New. In English.

Zustand: New. pp. 462.

Taschenbuch. Zustand: Neu. VLSI-SoC: Technology Advancement on SoC Design | 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Singapore, October 4-8, 2021, Revised and Extended Selected Papers | Victor Grimblatt (u. a.) | Taschenbuch | IFIP Advances in Information and Communication Technology | xiv | Englisch | 2023 | Springer | EAN 9783031168208 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Zustand: New. In English.

Taschenbuch. Zustand: Neu. VLSI DESIGN AND TECHNOLOGY | DESIGN FOR TESTABILITY | Mahesh Mudavath (u. a.) | Taschenbuch | Englisch | 2022 | LAP LAMBERT Academic Publishing | EAN 9786204954219 | Verantwortliche Person für die EU: SIA OmniScriptum Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu. …

Taschenbuch. Zustand: Neu. Introduction to VLSI Design & Technology | Shruti Oza-Rahurkar (u. a.) | Taschenbuch | 184 S. | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9783659582738 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. …

Zustand: New.

Taschenbuch. Zustand: Neu. Neuware - Every question about how a computer behaves ends at a transistor.How fast a processor can run. Why it burns power doing nothing. Why one node delivered a breakthrough and the next barely moved. All of it comes down to the physics of a device a few tens of nanometers wide - and most engineers were never taught it properly.Introductory courses stop at the long-channel current equation, a model that hasn't described a real transistor in decades. The research literature starts three levels above that. This handbook occupies the gap where working engineers actually spend their careers.Inside, you will find: - Every important result derived, not asserted - with the assumptions stated up front and the breaking point identified at the end- Worked examples that carry units through every step and reach answers you can check- The full arc from carrier statistics to the MOS capacitor, short-channel effects, scaling theory, high-field transport, gate stacks, CMOS integration, FinFET and nanosheet architectures, memory, and reliability- A glossary, a complete equation reference, and material property tables you will return to for yearsWritten for engineers, graduate students, and anyone who would rather understand a device than memorize rules that expire with the next generation.Stop guessing why your devices behave the way they do. Scroll up, click Buy Now, and start reading today.…

Taschenbuch. Zustand: Neu. VLSI Technology & Testability | Design & Testability | Prashant Chaturvedi (u. a.) | Taschenbuch | Englisch | 2021 | LAP LAMBERT Academic Publishing | EAN 9786203930474 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. …

Zustand: New. In English.

Zustand: New. In English.

Zustand: New. In English.

Paperback. Zustand: Brand New. 430 pages. 9.25x6.25x1.00 inches. In Stock.

Hardcover. Zustand: Brand New. 310 pages. 9.50x6.25x1.00 inches. In Stock.