Surface analysis polymers xps von briggs (8 Ergebnisse)

Soft cover. Zustand: Good. No Jacket. Condition : Good. Former university library copy with associated markings. Soft cover, no jacket. 198pp. No annotations or highlighting. Covered in protective laminate. Photo on request.

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Zustand: New. In English.

Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | The book describes the development of two powerful techniques for polymer surface studies.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.…

Zustand: New. In English.

Zustand: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 214 pages, 119 b/w illus. 19 tables. BIC Classification: PNN; TG. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 13. Weight in Grams: 605. . 1998. hardcover. . . . . Books ship from the US and Ireland. …

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.…