The book describes the development of two powerful techniques for polymer surface studies.
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Anbieter: MB Books, Derbyshire, Vereinigtes Königreich
Soft cover. Zustand: Good. No Jacket. Condition : Good. Former university library copy with associated markings. Soft cover, no jacket. 198pp. No annotations or highlighting. Covered in protective laminate. Photo on request. Artikel-Nr. 944798
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Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Artikel-Nr. ria9780521017534_new
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Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 216 pages, 119 b/w illus. 19 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 12. Weight in Grams: 350. . 2008. Revised ed. paperback. . . . . Books ship from the US and Ireland. Artikel-Nr. V9780521017534
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Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. Artikel-Nr. 9780521017534
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