Random access memories (37 Ergebnisse)

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Zustand: New. In English.

Paperback. Zustand: Brand New. 96 pages. 11.89x8.90x0.32 inches. In Stock.

paperback. Zustand: New. Our books are dispatched from a Yorkshire former cotton mill. We list via barcode/ISBN so please note that the images are stock images and may not be the exact copy you receive, furthermore the details about edition and year might not be accurate as many publishers reuse the same ISBN for multiple editions and as we simply scan a barcode or enter an ISBN we do not check the validity of the edition data when listing. If you're looking for an exact edition please don't order (at least not without checking with us first, although we don't always have time to check). We aim to dispatch prompty, the service used will depend on order value and book size. We can ship to most countries, see our shipping policies. Payment is via Abe only.…

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Zustand: New. 2013. Paperback. . . . . . Books ship from the US and Ireland.

Zustand: New. In English.

Hardcover. Zustand: Gut. C-02152 Ex-library with Stamp and Library-Signature in Good Condition, Some Traces of Use Sprache: Englisch Gewicht in Gramm: 550.

Taschenbuch. Zustand: Neu. Daft Punk: Random Access Memories | Songbook für Klavier, Gesang, Gitarre | Music Sales | Taschenbuch | Buch | Englisch | 2013 | Bosworth Musikverlag | EAN 9781783052578 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. …

hardcover. Zustand: Very Good. Testing and Testable Design of High-Density Random-Access Memories: v. 6 (Frontiers in Electronic Testing) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping.…

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Zustand: Hervorragend. Zustand: Hervorragend | Seiten: 256 | Sprache: Englisch | Produktart: Bücher | Phil was raised in the rural town of Clovis, CA where he attended elementary, junior high, and high school. He attended California Baptist College in Riverside, CA before returning to Clovis and completing his college degree at Fresno State College. He was finishing his junior year when he had to declare a major. After seeing a lot of Biology students going on field trips in the nearby Sierra Nevada Mountains, he decided a degree in Biology would be right for him. He wanted to teach Life Sciences in high school or become a Park Ranger with the National Park Service (NPS). There were many twists and turns in his career after college. He was hired as an intern in the Kings Canyon Unified School District teaching first fifth grade, then sixth grade. He was instrumental in developing an environmental education program for his sixth graders. He also worked seasonally as a Park Ranger with the NPS for seven summers and also worked weekends at Kings Canyon National Park for two years while teaching full time. After the war in Vietnam, there were so many veterans applying for full time park ranger positions that he was unable to break into the NPS full time. About that same time, the Corps of Engineers (COE) was beginning to hire park rangers and natural resource managers for their many lakes around the country. He was able to spend most of the rest of his career in the field of Resources Management in WA, OR, and ID. Along the way, he took on various teaching assignments with Walla Walla Community College and the University of Idaho. He helped develop and teach the COE's first enforcement classes nationwide. Phil is retired now and living in Dallas, OR. He decided he wanted to share some of his life experiences with friends, relatives, and others who might be interested in the work he chose for his career.Cover Photography : LEE JUILLERAT.…

Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

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Zustand: New. In English.

Zustand: New. In English.

Paperback. Zustand: Brand New. 240 pages. 9.25x6.10x0.55 inches. In Stock.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.…

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.…

Zustand: New.

Zustand: New.

Zustand: Gut. Zustand: Gut | Seiten: 424 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Zustand: New. 2026. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.

Zustand: New. 2026. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - Memory, the second function of a computer, has gradually become more complex in order to meet growing needs in terms of capacity, speed, security and energy efficiency. It takes the form of a component or system, such as a memory subassembly or a mass storage device. For several decades, there has been a strong trend towards integrating memory directly into the processor under the term embedded memory, of which cache memory is a typical example. Understanding its internal mechanisms and interfacing is essential for mastering the operation of a computer and programming it efficiently. Computer Memories 2 focuses on the static storage cell and its associated component, known as static random-access memory. The first part presents the main temporal characteristics of a generic random-access memory, as well as its electrical and mechanical properties, including aspects related to encapsulation. The second part focuses on the study of the first category of random-access semiconductor memory: asynchronous static memory, commonly referred to by the acronym SRAM (static random-access memory). The book details its temporal, electrical and mechanical characteristics, providing an in-depth understanding of its operation and technical specifications. …

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Ferroelectric Random Access Memories | Fundamentals and Applications | Hiroshi Ishiwara (u. a.) | Taschenbuch | Topics in Applied Physics | xiii | Englisch | 2010 | Springer | EAN 9783642073847 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Zustand: New. In English.