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In den WarenkorbPaperback. Zustand: Brand New. 147 pages. 9.45x6.61x0.32 inches. In Stock.
Verlag: Springer, Berlin|Springer International Publishing|Springer, 2023
ISBN 10: 3031127536 ISBN 13: 9783031127533
Sprache: Englisch
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Verlag: Springer, Berlin|Springer International Publishing|Springer, 2023
ISBN 10: 3031127501 ISBN 13: 9783031127502
Sprache: Englisch
Anbieter: moluna, Greven, Deutschland
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Verlag: Springer International Publishing, Springer International Publishing Sep 2023, 2023
ISBN 10: 3031127536 ISBN 13: 9783031127533
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Taschenbuch. Zustand: Neu. Neuware -This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 148 pp. Englisch.
Verlag: Springer International Publishing, Springer International Publishing Sep 2022, 2022
ISBN 10: 3031127501 ISBN 13: 9783031127502
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Buch. Zustand: Neu. Neuware -This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 148 pp. Englisch.
Verlag: Springer International Publishing, 2023
ISBN 10: 3031127536 ISBN 13: 9783031127533
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integratedcircuits. Theauthor covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmentalCoveragesalso includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Verlag: Springer International Publishing, 2022
ISBN 10: 3031127501 ISBN 13: 9783031127502
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integratedcircuits. Theauthor covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmentalCoveragesalso includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Verlag: Springer International Publishing, 2023
ISBN 10: 3031127536 ISBN 13: 9783031127533
Sprache: Englisch
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Noise Contamination in Nanoscale VLSI Circuits | Selahattin Sayil | Taschenbuch | xi | Englisch | 2023 | Springer International Publishing | EAN 9783031127533 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.