Noise Contamination in Nanoscale VLSI Circuits (Synthesis Lectures on Digital Circuits & Systems) - Softcover

Buch 1 von 8: Synthesis Lectures on Digital Circuits & Systems

Sayil, Selahattin

 
9783031127533: Noise Contamination in Nanoscale VLSI Circuits (Synthesis Lectures on Digital Circuits & Systems)
Softcover
ISBN 10: 3031127536 ISBN 13: 9783031127533
Verlag: Springer, 2023

Inhaltsangabe

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

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Über die Autorin bzw. den Autor

Selahattin Sayil received the M.Sc. degree from the Pennsylvania State University, University Park, PA, in 1996 and the Ph.D. degree in Electrical Engineering from Vanderbilt University, TN, in 2000. He is currently a Professor and Distinguished Faculty Fellow in Electrical Engineering at Lamar University, where he leads the VLSI CAD and Signal Integrity Group. 
His current research interests include mitigation of radiation effects in VLSI, interconnect delay and noise analysis, low-power design and testing. His teaching interests include online teaching, high-impact online labs and virtual team learning. He has authored two books, two book chapters and published near thirty refereed journal articles that include special feature articles, and presented at many international conferences. He is a member of IEEE and serves as an Associate Editor for International Journal of Electronics.

Von der hinteren Coverseite

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

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Verlag
Springer
Erscheinungsdatum
2023
Sprache
Englisch
ISBN 10 
3031127536
ISBN 13 
9783031127533
Einband
Tapa blanda
Auflage
1
Anzahl der Seiten
148
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Deutschland

Weitere beliebte Ausgaben desselben Titels

9783031127502: Noise Contamination in Nanoscale VLSI Circuits (Synthesis Lectures on Digital Circuits & Systems)

Vorgestellte Ausgabe

ISBN 10:  3031127501 ISBN 13:  9783031127502
Verlag: Springer-Verlag GmbH, 2022
Hardcover