Verlag: Springer International Publishing, 2013
ISBN 10: 3319007580 ISBN 13: 9783319007588
Sprache: Englisch
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In den WarenkorbZustand: Sehr gut. Zustand: Sehr gut | Seiten: 132 | Sprache: Englisch | Produktart: Bücher.
Verlag: Springer International Publishing, 2013
ISBN 10: 3319007580 ISBN 13: 9783319007588
Sprache: Englisch
Anbieter: Buchpark, Trebbin, Deutschland
EUR 51,94
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In den WarenkorbZustand: Sehr gut. Zustand: Sehr gut | Seiten: 132 | Sprache: Englisch | Produktart: Bücher.
Verlag: Springer International Publishing, 2013
ISBN 10: 3319007580 ISBN 13: 9783319007588
Sprache: Englisch
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In den WarenkorbBuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - An energetic charged particle beam introduced to an rf cavity excites a wakefield therein. This wakefield can be decomposed into a series of higher order modes and multipoles, which for sufficiently small beam offsets are dominated by the dipole component. This work focuses on using these dipole modes to detect the beam position in third harmonic superconducting S-band cavities for light source applications. A rigorous examination of several means of analysing the beam position based on signals radiated to higher order modes ports is presented. Experimental results indicate a position resolution, based on this technique, of 20 microns over a complete module of 4 cavities. Methods are also indicated for improving the resolution and for applying this method to other cavity configurations. This work is distinguished by its clarity and potential for application to several other international facilities. The material is presented in a didactic style and is recommended both for students new to the field, and for scientists well-versed in the field of rf diagnostics.
Verlag: Springer International Publishing, Springer International Publishing Aug 2013, 2013
ISBN 10: 3319007580 ISBN 13: 9783319007588
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
EUR 106,99
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In den WarenkorbBuch. Zustand: Neu. Neuware -An energetic charged particle beam introduced to an rf cavity excites a wakefield therein. This wakefield can be decomposed into a series of higher order modes and multipoles, which for sufficiently small beam offsets are dominated by the dipole component. This work focuses on using these dipole modes to detect the beam position in third harmonic superconducting S-band cavities for light source applications. A rigorous examination of several means of analysing the beam position based on signals radiated to higher order modes ports is presented. Experimental results indicate a position resolution, based on this technique, of 20 microns over a complete module of 4 cavities. Methods are also indicated for improving the resolution and for applying this method to other cavity configurations. This work is distinguished by its clarity and potential for application to several other international facilities. The material is presented in a didactic style and is recommended both for students new to the field, and for scientists well-versed in the field of rf diagnostics.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 132 pp. Englisch.
Verlag: Springer, Berlin, Springer International Publishing, Springer, 2016
ISBN 10: 3319346164 ISBN 13: 9783319346168
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
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In den WarenkorbTaschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - An energetic charged particle beam introduced to an rf cavity excites a wakefield therein. This wakefield can be decomposed into a series of higher order modes and multipoles, which for sufficiently small beam offsets are dominated by the dipole component. This work focuses on using these dipole modes to detect the beam position in third harmonic superconducting S-band cavities for light source applications. A rigorous examination of several means of analysing the beam position based on signals radiated to higher order modes ports is presented. Experimental results indicate a position resolution, based on this technique, of 20 microns over a complete module of 4 cavities. Methods are also indicated for improving the resolution and for applying this method to other cavity configurations. This work is distinguished by its clarity and potential for application to several other international facilities. The material is presented in a didactic style and is recommended both for students new to the field, and for scientists well-versed in the field of rf diagnostics.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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In den WarenkorbZustand: New. In.
Verlag: Springer International Publishing, 2013
ISBN 10: 3319007580 ISBN 13: 9783319007588
Sprache: Englisch
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In den WarenkorbHRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
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In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 132 pages. 9.25x6.10x0.31 inches. In Stock.
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In den WarenkorbHardcover. Zustand: Brand New. 2013 edition. 118 pages. 9.25x6.25x0.75 inches. In Stock.