Isbn: 9783642064531 - lifetime spectroscopy: a method of defect characterization in silicon for photovoltaic applications (springer series in materials science, 85, band 85) (5 Ergebnisse)

Zustand: New. In English.

Zustand: New.

Taschenbuch. Zustand: Neu. Lifetime Spectroscopy | A Method of Defect Characterization in Silicon for Photovoltaic Applications | Stefan Rein | Taschenbuch | Springer Series in Materials Science | xxvi | Englisch | 2010 | Springer | EAN 9783642064531 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.…

Paperback. Zustand: Brand New. 515 pages. 9.21x6.14x1.05 inches. In Stock.