9783540418184 - high-resolution imaging and spectrometry of materials (springer series in materials science, 50, band 50) (4 Ergebnisse)
Sprache: Englisch
Verlag: Springer Verlag, 2002
Serie: Buch 60 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: CSG Onlinebuch GMBH, Darmstadt, DeutschlandCSG Onlinebuch GMBH
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EUR 46,75
EUR 95,00 VersandVersand von Deutschland nach USAAnzahl: 1 verfügbar
Gebunden. Zustand: Gut. Gebraucht - Gut Zustand: Gut, Mängelexemplar, XIV, 440 p. 211 illus., 32 in color About this book: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and int…erface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students. Written for researchers.
Sprache: Englisch
Verlag: Springer, 2002
Serie: Buch 60 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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EUR 165,92
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Zustand: New. In.
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Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2002
Serie: Buch 60 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 160,49
EUR 64,68 VersandVersand von Deutschland nach USAAnzahl: 1 verfügbar
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characteri…sation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
Sprache: Englisch
Verlag: Springer Verlag, 2003
Serie: Buch 60 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 240,02
EUR 14,61 VersandVersand von Vereinigtes Königreich nach USAAnzahl: 2 verfügbar
Hardcover. Zustand: Brand New. 440 pages. 9.25x6.25x0.75 inches. In Stock.
