Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 114,38
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 167,34
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 517 pages. 9.25x6.25x1.50 inches. In Stock.
Sprache: Englisch
Verlag: Springer International Publishing, Springer Nature Switzerland, 2014
ISBN 10: 3319089935 ISBN 13: 9783319089935
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ('become hot'), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.