9781493301737 - reliability and failure of electronic materials and devices von ohring, milton (3 Ergebnisse)
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- Softcover
Anbieter: Bookbot, Prague, TschechienBookbot
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EUR 55,49
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Softcover. Zustand: Fine. Leichte Kratzer / Abnutzungen / Druckstellen; Gebrochener Buchrücken / Seiten oder Softcover umgeknickt; Vergilbt / ausgeblichen. This book serves as a valuable reference for reliability professionals and a text for advanced undergraduate or graduate students, introducing the extensive reliability liter…ature related to microelectronic and electronic devices. It addresses chip and packaging level failures, linking them to atomic mechanisms and models that explain degradation, alongside the statistical analysis of lifetime data. Key failure mechanisms discussed include electromigration, dielectric radiation damage, and mechanical failures of contacts and solder joints. A central theme is the relationship between product defects, yield, and reliability, emphasizing their role in failures and methods for experimental exposure. Readers will enhance their understanding of failure mechanisms in electronic materials and devices, develop skills in the mathematical handling of reliability data, and gain insights into future technology trends and associated reliability challenges. Key features include discussions on reliability and failure at both chip and packaging levels, the impact of defects on yield and reliability, a tutorial on reliability mathematics, and a focus on various failure mechanisms and defect detection methods.
- Softcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
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EUR 215,92
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Paperback. Zustand: Brand New. 1st edition. 692 pages. 9.00x6.00x1.61 inches. In Stock.
- Softcover
Anbieter: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, DeutschlandBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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EUR 539,90
EUR 39,95 VersandVersand von Deutschland nach USAAnzahl: 1 verfügbar
Zustand: gut. 1998. Reliability and Failure of Electronic Materials and Devices In englischer Sprache. pages.

