ISBN: 9781402076527 - verification by error modeling: using testing techniques in hardware verification (frontiers in electronic testing, 25, band 25) (4 Ergebnisse)

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  • Sprache: Englisch

    Verlag: Kluwer Academic Publishers, 2003

    1402076525 / 9781402076527

    Serie: Buch 4 von 40 - Frontiers in Electronic Testing

    • Hardcover

    Anbieter: World of Books (was SecondSale), Montgomery, IL, USAWorld of Books (was SecondSale)

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    Hardback. Zustand: Good. 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be ?imminently doable? by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design.…

  • Sprache: Englisch

    Verlag: Springer, 2003

    1402076525 / 9781402076527

    Serie: Buch 4 von 40 - Frontiers in Electronic Testing

    • Hardcover

    Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections

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    Zustand: New. In English.

  • Sprache: Englisch

    Verlag: Springer US, 2003

    1402076525 / 9781402076527

    Serie: Buch 4 von 40 - Frontiers in Electronic Testing

    • Hardcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

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    Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be 'imminently doable' by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design. …

  • Sprache: Englisch

    Verlag: Kluwer Academic Publishers, 2003

    1402076525 / 9781402076527

    Serie: Buch 4 von 40 - Frontiers in Electronic Testing

    • Hardcover

    Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore

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    Zustand: New. Presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. This book brings the results in the direction of merging manufacturing test vector generation and verification. Series: Frontiers in Electronic Testing. Num Pages: 231 pages, biography. BIC Classification: TJFM1. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 2003. Hardback. . . . . Books ship from the US and Ireland. …