ISBN: 9780890066522 - reliability and degradation of iii-v optical devices (artech house optoelectronics library) (9 Ergebnisse)

Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Zustand: As New. Unread book in perfect condition.

Zustand: New.

Zustand: New.

Hardback. Zustand: New. Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.…

Zustand: New. &Uumlber den AutorOsamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of.

Buch. Zustand: Neu. Neuware - Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.…

Hardback. Zustand: New. Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.…

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 372 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.