9780863417450 - test and diagnosis of analogue, mixed-signal and rf integrated circuits: the system on chip approach (circuits, devices and systems, band 19) (5 Ergebnisse)
- Softcover
Anbieter: Majestic Books, Hounslow, Vereinigtes KönigreichMajestic Books
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EUR 20,19
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Zustand: New. pp. 416.
Sprache: Englisch
Verlag: The Institution of Engineering and Technology, 2008
- Softcover
- Internationale Ausgabe
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USARomtrade Corp.
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EUR 30,66
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Zustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed… on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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- Softcover
Anbieter: moluna, Greven, Deutschlandmoluna
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EUR 125,96
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Zustand: New. Über den AutorYichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal .
Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: The System on Chip Approach
- Softcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
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EUR 170,61
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Paperback. Zustand: Brand New. 416 pages. 9.00x6.00x1.00 inches. In Stock.
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Sprache: Englisch
Verlag: Institution Of Engineering & Technology Mai 2008, 2008
- Softcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 172,00
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Taschenbuch. Zustand: Neu. Neuware - Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system includ…ing both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
