Isbn: 9780521773560 - testing of digital systems (8 Ergebnisse)

Zustand: Good. 1st Edition. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.…

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2250grams, ISBN:9780521773560. …

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2250grams, ISBN:9780521773560. …

Zustand: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.

Zustand: New. In English.

Zustand: New. The most comprehensive and wide ranging book on the testing of semiconductor devices and systems. Num Pages: 1016 pages, 90 tables. BIC Classification: TJF. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 247 x 174 x 49. Weight in Grams: 2185. . 2003. hardcover. . . . . Books ship from the US and Ireland. …

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.…

Hardcover. Zustand: Brand New. 1st edition. 1016 pages. 10.20x7.25x1.75 inches. In Stock.