The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.
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Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.
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Anbieter: Better World Books: West, Reno, NV, USA
Zustand: Good. 1st Edition. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Artikel-Nr. GRP64429446
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Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2250grams, ISBN:9780521773560. Artikel-Nr. 4847241
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Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2250grams, ISBN:9780521773560. Artikel-Nr. 4847240
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Anbieter: World of Books (was SecondSale), Montgomery, IL, USA
Zustand: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc. Artikel-Nr. 00101948212
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Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Artikel-Nr. ria9780521773560_new
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Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. The most comprehensive and wide ranging book on the testing of semiconductor devices and systems. Num Pages: 1016 pages, 90 tables. BIC Classification: TJF. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 247 x 174 x 49. Weight in Grams: 2185. . 2003. hardcover. . . . . Books ship from the US and Ireland. Artikel-Nr. V9780521773560
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Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. Artikel-Nr. 9780521773560
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Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 1st edition. 1016 pages. 10.20x7.25x1.75 inches. In Stock. Artikel-Nr. x-0521773563
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