9780521158596 - focused ion beam systems: basics and applications (4 Ergebnisse)
- Softcover
Anbieter: Anybook.com, Lincoln, Vereinigtes KönigreichAnybook.com
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EUR 62,03
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Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:9780521158596.
- Softcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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EUR 78,44
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Zustand: New. In.
- Softcover
Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore
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EUR 111,68
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Zustand: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, black & white illustrations. BIC Classification: TBN; TGM; TJFD5. Category: (P) Professional & Vocational. Dimension: 246 x 169 x 24. Weight in Grams: 668. . 2…011. Reissue. paperback. . . . . Books ship from the US and Ireland.
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- Softcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 104,93
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, a…nalytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
