Ul hamid anwar (9 Ergebnisse)
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Taschenbuch. Zustand: Neu. A Beginners' Guide to Scanning Electron Microscopy | Anwar Ul-Hamid | Taschenbuch | xxii | Englisch | 2019 | Springer Nature Switzerland | EAN 9783030074982 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbiete…r: preigu.
Sprache: Englisch
Verlag: Springer International Publishing, Springer Nature Switzerland, 2019
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistr…y of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds-including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia-emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners' Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This bookprovides a concise and accessible introduction to the essentials of SEMincludes a large number of illustrations specifically chosen to aid readers' understanding of key conceptshighlights recent advances in instrumentation, imaging and sample preparation techniquesoffers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
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Zustand: New. This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a .
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Hardcover. Zustand: Brand New. 402 pages. 9.50x6.25x1.00 inches. In Stock.
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Buch. Zustand: Neu. Neuware - This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic mate…rials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds-including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia-emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners' Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Sprache: Englisch
Verlag: CRC Press, 2004
Serie: Mechanical Engineering, Buch 57 von 115. Buch 57 von 115 - Mechanical Engineering
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Gebunden. Zustand: New. Hani M. Tawancy, Anwar Ul-Hamid, Nureddin M. AbbasFilling a gap in the literature, Practical Engineering Failure Analysis vividly demonstrates the correct methodology to conduct successful failure analyses, as well as offering the background nec.
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[CAm], Springer International Publishing, [2023]. XXII,402 pp. 122 b./w. ills & 98 ills in col. Orig. hardcover (boards). 8vo. [ISBN: 978-3-319-98481-0]. - As new !This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no backgroun…d in the area. - Corrected 2023 edition. First published in 2023.
