Sprache: Englisch
Verlag: Cambridge University Press, 2013
ISBN 10: 1107036410 ISBN 13: 9781107036413
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 133,96
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 203,35
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 504 pages. 10.00x7.25x1.25 inches. In Stock.
Sprache: Englisch
Verlag: Cambridge University Press, 2013
ISBN 10: 1107036410 ISBN 13: 9781107036413
Anbieter: Kennys Bookstore, Olney, MD, USA
EUR 259,61
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. 2013. 1st Edition. Hardcover. A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges. Editor(s): Teppati, Valeria; Ferrero, Andrea; Sayed, Mohamed. Series: The Cambridge RF and Microwave Engineering Series. Num Pages: 471 pages, 340 b/w illus. 10 tables. BIC Classification: TJFN. Category: (UU) Undergraduate. Dimension: 182 x 248 x 31. Weight in Grams: 1122. . . . . . Books ship from the US and Ireland.
Sprache: Englisch
Verlag: Cambridge University Press, 2013
ISBN 10: 1107036410 ISBN 13: 9781107036413
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.