Stroud charles e e (13 Ergebnisse)
Sprache: Englisch
Verlag: Springer, 2002
- Hardcover
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Zustand: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Zustand: New. pp. xxxvi + 856 Illus.
Sprache: Englisch
Verlag: Springer, 2002
- Hardcover
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hardcover. Zustand: Very Good. A Designerâs Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearl…y been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
Sprache: Englisch
Verlag: Springer -, 2002
- Hardcover
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hardcover. Zustand: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
Sprache: Englisch
Verlag: Kluwer Academic, 2002
- Hardcover
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Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9781402070501.
Sprache: Englisch
Verlag: Springer, 2013
- Softcover
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Zustand: New. In.
Sprache: Englisch
Verlag: Springer, 2002
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Zustand: New. In.
Weitere BilderSprache: Englisch
Verlag: Humana, 2013
- Softcover
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Taschenbuch. Zustand: Neu. A Designer's Guide to Built-In Self-Test | Charles E. Stroud | Taschenbuch | xx | Englisch | 2013 | Humana | EAN 9781475776263 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer US, Humana, 2013
- Softcover
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the curre…nt time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Sprache: Englisch
Verlag: Springer US, Springer New York, 2002
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time…, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Sprache: Englisch
Verlag: Springer, 2013
- Softcover
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Paperback. Zustand: Brand New. 340 pages. 9.30x6.20x0.80 inches. In Stock.
Sprache: Englisch
Verlag: Springer, 2002
- Hardcover
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Hardcover. Zustand: Brand New. 344 pages. 9.50x6.50x1.00 inches. In Stock.
Sprache: Englisch
Verlag: Kluwer Academic Publishers, 2002
- Hardcover
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Zustand: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as wel…l as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . . Books ship from the US and Ireland.
