Sprache: Französisch
Verlag: Musee Marey, Beaune, France, 1995
ISBN 10: 2711833178 ISBN 13: 9782711833177
Anbieter: Jeff Hirsch Books, ABAA, Wadsworth, IL, USA
Erstausgabe
First Edition. First edition. Softcover. 158 pages. Exhibition catalog for a show that ran May 20 through September 10, 1995. A look at the work of Etienne-Jules Marey and the artists who came after him. Text in French. Introduction by Marion Leuba. Additional text contributions by Virgilio Tosi, Marta Braun, Monique Sicard, Andrej Turowski, Thierry Pozzo, and Brigitte Berg. A near fine copy in wrappers.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 166,66
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 166,66
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
EUR 135,30
Anzahl: Mehr als 20 verfügbar
In den WarenkorbGebunden. Zustand: New. Provides a hands-on tool kit for designing and simulating any type of CMOS (complementary metal-oxide semiconductor) circuit. This book introduces the design and simulation of CMOS integrated circuits in deep summicron technology, covering MOS devices, inve.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Electromagnetic Compatibility of Integrated Circuits | Techniques for low emission and susceptibility | Sonia Ben Dhia (u. a.) | Taschenbuch | xiii | Englisch | 2014 | Springer | EAN 9781461498315 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer US, Springer New York, 2014
ISBN 10: 1461498317 ISBN 13: 9781461498315
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.
Sprache: Englisch
Verlag: Mcgraw-Hill Education LLC (Professional) Mär 2007, 2007
ISBN 10: 0071488391 ISBN 13: 9780071488396
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This book provides a hands-on tool kit for designing and simulating any type of CMOS (complementary metal-oxide semiconductor) circuit. It introduces the design and simulation of CMOS integrated circuits in deep summicron technology, covering MOS devices, inverters, logic gates, arithmetics, and interconnects and analog basic cells.
Zustand: New. Editor(s): Dhia, Sonia Ben; Ramdani, Mohamed; Sicard, Etienne. Num Pages: 486 pages, biography. BIC Classification: TJF; TJFC; TJFN; TRC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 25. Weight in Grams: 741. . 2014. Paperback. . . . . Books ship from the US and Ireland.
Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Französisch | Produktart: Bücher | Keine Beschreibung verfügbar.