Verlag: CRC Press, 2020
ISBN 10: 0367607093 ISBN 13: 9780367607098
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. | Seiten: 140 | Sprache: Englisch | Produktart: Bücher.
Verlag: CRC Press Jun 2020, 2020
ISBN 10: 0367607093 ISBN 13: 9780367607098
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Neuware - This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
Verlag: Springer Berlin Heidelberg, 2012
ISBN 10: 3642314937 ISBN 13: 9783642314933
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012.The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions.The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Verlag: Taylor & Francis Ltd (Sales) Apr 2018, 2018
ISBN 10: 0815378823 ISBN 13: 9780815378822
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.